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Microscope Device Component
Known as:
Microscope
An instrument that is used to look at cells and other small objects that cannot be seen with the eye alone.
National Institutes of Health
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2 relations
Medical Device Component or Accessory
Microscopes
Papers overview
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Highly Cited
2004
Highly Cited
2004
Controlled Growth of Y-Junction Nanotubes Using Ti-Doped Vapor Catalyst
N. Gothard
,
C. Daraio
,
J. Gaillard
,
R. Zidan
,
Sungho Jin
,
A. Rao
2004
Corpus ID: 30232676
We demonstrate a bulk process for the synthesis of Y-junction carbon nanotubes using Ti-doped Fe catalysts. It is shown that the…
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Highly Cited
2001
Highly Cited
2001
Writing and reading perpendicular magnetic recording media patterned by a focused ion beam
J. Lohau
,
A. Moser
,
C. Rettner
,
M. Best
,
B. Terris
2001
Corpus ID: 31009892
We have written and read bit patterns on arrays of square islands cut with a focused ion beam into granular perpendicular…
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Highly Cited
2000
Highly Cited
2000
Low-energy-deposited Au clusters investigated by high-resolution electron microscopy and molecular dynamics simulations
B. Pauwels
,
G. Tendeloo
,
+4 authors
M. Hou
2000
Corpus ID: 73611009
We investigated the cluster-surface interaction of Au clusters deposited on MgO cubes and on amorphous carbon, and its influence…
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Highly Cited
1996
Highly Cited
1996
Biosensor based on force microscope technology
D. R. Baselt
,
Gil U. Lee
,
R. Colton
1996
Corpus ID: 18498813
We are developing a sensor capable of detecting biological species such as cells, proteins, toxins, and DNA at concentrations as…
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Highly Cited
1992
Highly Cited
1992
Friction and wear of Langmuir-Blodgett films observed by friction force microscopy.
Meyer
,
Overney
,
+4 authors
Güntherodt
Physical Review Letters
1992
Corpus ID: 42435861
Lubrication is documented on a microscopic scale with a friction force microscope. A reduction in friction is observed for…
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Highly Cited
1991
Highly Cited
1991
Compensating surface defects induced by Si doping of GaAs.
Pashley
,
Haberern
Physical Review Letters
1991
Corpus ID: 42223899
We have made direct experimental observation of a new mechanism for Fermi-level pinning in Si-doped (001) GaAs. Scanning…
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Highly Cited
1990
Highly Cited
1990
Observation of metallic adhesion using the scanning tunneling microscope.
Dürig
,
Züger
,
Pohl
Physical Review Letters
1990
Corpus ID: 12421467
The interaction between an Ir tip and an Ir sample was investigated during normal tunneling operation of the scanning tunneling…
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Highly Cited
1988
Highly Cited
1988
Observation of individual organic molecules at a crystal surface with use of a scanning tunneling microscope.
Sleator
,
Tycko
Physical Review Letters
1988
Corpus ID: 32441989
A scanning-tunneling-microscopy (STM) study of the surface of a TTF-TCNQ (tetrathiafulvalene tetracyanoquinodimethane) crystal is…
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Highly Cited
1984
Highly Cited
1984
Ray-Optical Evaluation of V(z) in the Reflection Acoustic Microscope
H. Bertoni
IEEE Transactions on Sonics and Ultrasonics
1984
Corpus ID: 12365077
On utilise l'optique des rayons pour developper des expressions analytiques simples donnant la variation V(z) de la tension de…
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Highly Cited
1971
Highly Cited
1971
A high resolution electron spectrometer for use in transmission scanning electron microscopy.
A. Crewe
,
M. Isaacson
,
D. Johnson
Review of Scientific Instruments
1971
Corpus ID: 10532603
The design and construction of a double focusing uniform field magnetic electron spectrometer are described. The pole pieces of…
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