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Metal gate
A metal gate, in the context of a lateral Metal-Oxide-Semiconductor MOS stack, is just that—the gate material is made from a metal. For decades (i.e…
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Apple A6
Apple A6X
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Apple mobile application processors
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Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2013
Highly Cited
2013
p-GaN Gate HEMTs With Tungsten Gate Metal for High Threshold Voltage and Low Gate Current
I. Hwang
,
Jongseob Kim
,
+9 authors
U. Chung
IEEE Electron Device Letters
2013
Corpus ID: 21652635
The impact of gate metals on the threshold voltage (VTH) and the gate current of p-GaN gate high-electron-mobility transistors…
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Highly Cited
2011
Highly Cited
2011
Work-Function-Tuned TiN Metal Gate FDSOI Transistors for Subthreshold Operation
S. Vitale
,
Jakub Kedzierski
,
P. Healey
,
Peter Wyatt
,
C. Keast
IEEE Transactions on Electron Devices
2011
Corpus ID: 23872051
The effective work function of a reactively sputtered TiN metal gate is shown to be tunable from 4.30 to 4.65 eV. The effective…
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Highly Cited
2011
Highly Cited
2011
The evolution of scaling from the homogeneous era to the heterogeneous era
M. Bohr
International Electron Devices Meeting
2011
Corpus ID: 26701561
Traditional MOSFET scaling served our industry well for more than three decades by providing continuous improvements in…
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Highly Cited
2008
Highly Cited
2008
FDSOI devices with thin BOX and ground plane integration for 32nm node and below
C. Fenouillet-Béranger
,
S. Denorme
,
+25 authors
Thomas Skotnicki
European Solid-State Device Research Conference
2008
Corpus ID: 34592140
Highly Cited
2006
Highly Cited
2006
Silicon Vertically Integrated Nanowire Field Effect Transistors
J. Goldberger
,
A. Hochbaum
,
R. Fan
,
P. Yang
2006
Corpus ID: 11642569
Silicon nanowires have received considerable attention as transistor components because they represent a facile route toward sub…
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Highly Cited
2006
Highly Cited
2006
Tri-Gate Transistor Architecture with High-k Gate Dielectrics, Metal Gates and Strain Engineering
J. Kavalieros
,
Brian Doyle
,
+11 authors
R. Chau
Symposium on VLSI Technology, . Digest of…
2006
Corpus ID: 21974539
We have combined the benefits of the fully depleted tri-gate transistor architecture with high-k gate dielectrics, metal gate…
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Review
2005
Review
2005
The end of CMOS scaling: toward the introduction of new materials and structural changes to improve MOSFET performance
Thomas Skotnicki
,
J. Hutchby
,
Tsu-Jae King
,
H.-S. Philip Wong
,
Frederic Boeuf
IEEE Circuits and Devices Magazine
2005
Corpus ID: 6389553
The rapid cadence of metal-oxide semiconductor field-effect transistor (MOSFET) scaling, as seen in the new 2003 International…
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Highly Cited
2005
Highly Cited
2005
Suspended-gate MOSFET: bringing new MEMS functionality into solid-state MOS transistor
N. Abelé
,
R. Fritschi
,
K. Boucart
,
F. Casset
,
P. Ancey
,
A. Ionescu
IEEE InternationalElectron Devices Meeting…
2005
Corpus ID: 36708332
Reference NANOLAB-CONF-2005-019View record in Web of Science Record created on 2007-05-16, modified on 2017-05-10
Highly Cited
2001
Highly Cited
2001
Dual work function metal gate CMOS technology using metal interdiffusion
I. Polishchuk
,
P. Ranade
,
Tsu-Jae King
,
Chenming Hu
IEEE Electron Device Letters
2001
Corpus ID: 16136205
In this letter, we propose a new metal-gate CMOS technology that uses a combination of two metals to achieve low threshold…
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Highly Cited
2000
Highly Cited
2000
High breakdown GaN HEMT with overlapping gate structure
N. Zhang
,
S. Keller
,
G. Parish
,
S. Heikman
,
S. Denbaars
,
U. Mishra
IEEE Electron Device Letters
2000
Corpus ID: 20608582
GaN high electron mobility transistors (HEMTs) were fabricated using an overlapping-gate technique in which the drain-side edge…
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