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Metal gate
A metal gate, in the context of a lateral Metal-Oxide-Semiconductor MOS stack, is just that—the gate material is made from a metal. For decades (i.e…
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Apple A6
Apple A6X
Apple A7
Apple mobile application processors
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2008
2008
SOI vs. bulk FinFET: Body doping and corner effects influence on device characteristics
M. Poljak
,
V. Jovanovic
,
T. Suligoj
MELECON - The 14th IEEE Mediterranean…
2008
Corpus ID: 44576153
SOI and bulk FinFET were analyzed by a three-dimensional numerical device simulator and their electrical characteristics were…
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Highly Cited
2007
Highly Cited
2007
Control and Detection of Organosilane Polarization on Nanowire Field-Effect Transistors
Meng-Yeh Lin
,
Chia-Jung Chu
,
+7 authors
Chiidong Chen
2007
Corpus ID: 33217119
We demonstrated control and detection of UV-induced 3-aminopropyltriethoxysilane (APTES) polarization using silicon nanowire…
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Highly Cited
2006
Highly Cited
2006
Challenges and Opportunities for High Performance 32 nm CMOS Technology
J. Sleight
,
I. Lauer
,
+13 authors
M. Khare
International Electron Devices Meeting
2006
Corpus ID: 1310669
Starting with the 45 nm node, a tradeoff between performance and density exists that become more severe at the 32 nm node. An in…
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2006
2006
A Novel Electrode-Induced Strain Engineering for High Performance SOI FinFET utilizing Si (1hannel for Both N and PMOSFETs
C. Kang
,
R. Choi
,
+13 authors
R. Jammy
International Electron Devices Meeting
2006
Corpus ID: 33576937
If Si (110) channel can be used for both nMOS and pMOS FinFET, the implementation of FinFET can be simplified significantly…
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Highly Cited
2006
Highly Cited
2006
Metal gate-HfO/sub 2/ MOS structures on GaAs substrate with and without Si interlayer
I. Ok
,
H. Kim
,
+8 authors
J.C. Lee
IEEE Electron Device Letters
2006
Corpus ID: 37537782
In this letter, we studied the effects of post-deposition anneal (PDA) time and Si interface control layer (ICL) on the…
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2005
2005
Integration of PtSi-based Schottky-barrier p-MOSFETs with a midgap tungsten gate
G. Larrieu
,
E. Dubois
IEEE Transactions on Electron Devices
2005
Corpus ID: 19589238
This paper demonstrates the successful integration of Schottky barrier (SB) MOSFETs that feature platinum silicide (PtSi) source…
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Highly Cited
2004
Highly Cited
2004
Quantum transport through short semiconducting nanotubes: A complex band structure analysis
P. Pomorski
,
C. Roland
,
Hong Guo
2004
Corpus ID: 119353137
With a recently developed ab initio nonequilibrium Green's function formalism, we have examined the problem of quantum transport…
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Highly Cited
2004
Highly Cited
2004
Dynamics of trapped charge in GaN/AlGaN/GaN high electron mobility transistors grown by plasma-assisted molecular beam epitaxy
O. Mitrofanov
,
M. Manfra
2004
Corpus ID: 123068188
We report on the dynamics of trapped charge in unpassivated GaN/AlGaN/GaN high electron mobility transistors grown by plasma…
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Highly Cited
2000
Highly Cited
2000
Characteristics of TaN gate MOSFET with ultrathin hafnium oxide (8 /spl Aring/-12 /spl Aring/)
B. Lee
,
R. Choi
,
+7 authors
J. Lee
International Electron Devices Meeting…
2000
Corpus ID: 56269695
MOSFET's with equivalent oxide thickness of 8-12 /spl Aring/ have been demonstrated by using high-K gate dielectric thin films…
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Highly Cited
1978
Highly Cited
1978
Methods for Hierarchical Automatic Layout of Custom LSI Circuit Masks
B. Preas
,
C. Gwyn
Design Automation Conference
1978
Corpus ID: 16602268
A new automatic IC mask layout code is described which avoids most of the problems inherent in the present generation of layout…
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