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InFed

Known as: inf 
National Institutes of Health

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2 relations
2 ML Iron-Dextran Complex 50 MG/ML Injection [InFed]

Broader (1)

Iron-Dextran Complex

Papers overview

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Highly Cited
2012
Highly Cited
2012
Why does the environmental influence on group and cluster galaxies extend beyond the virial radius
In the local Universe, galaxies in groups and clusters contain less gas and are less likely to be forming stars than their field… 
Highly Cited
2011
Highly Cited
2011
Fractalkine and CX3CR1 regulate hippocampal neurogenesis in adult and aged rats
Highly Cited
2011
Highly Cited
2011
Conditioned fear is modulated by D2 receptor pathway connecting the ventral tegmental area and basolateral amygdala
Highly Cited
2009
Highly Cited
2009
Hot-Carrier acceleration factors for low power management in DC-AC stressed 40nm NMOS node at high temperature
Channel Hot-Carrier degradation presents a renewed interest in the last NMOS nodes where the device reliability of bulk silicon… 
Review
1988
Review
1988
Receptor-mediated activation of phospholipase A2 via GTP-binding proteins: arachidonic acid and its metabolites as second messengers
Highly Cited
1987
Highly Cited
1987
Effects of 5, 7-dihydroxytryptamine on serotonin1 and serotonin2 receptors throughout the rat central nervous system using quantitative autoradiography
Highly Cited
1986
Highly Cited
1986
Synergistic effects of D1 and D2 dopamine agonists on turning behaviour in rats
Highly Cited
1977
Highly Cited
1977
Electronic processes at grain boundaries in polycrystalline semiconductors under optical illumination
  • H. CardE. Yang
  • IEEE Transactions on Electron Devices
  • 1977
  • Corpus ID: 24958406
The dependence of minority carrier lifetime (τ) on the doping concentration N<inf>d</inf>, grain size<tex>d</tex>and interface… 
Highly Cited
1975
Highly Cited
1975
The complex LMS algorithm
A least-mean-square (LMS) adaptive algorithm for complex signals is derived. The original Widrow-Hoff LMS algorithm is W<inf>j+l… 
Highly Cited
1975
Highly Cited
1975
Theory of the MOS transistor in weak inversion-new method to determine the number of surface states
The drain current I<inf>D</inf>versus gate voltage V<inf>G</inf>of an MOST operating in weak inversion, and the influence of… 
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