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IEEE Journal of Solid-State Circuits
The IEEE Journal of Solid-State Circuits (JSSC) is a is a monthly peer-reviewed scientific journal on new developments and research in solid-state…
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2017
2017
Correction to ?Top Cited IEEE Journal of Solid-State Circuits Papers? [Correction]
Abira Sengupta
,
D. Hodges
2017
Corpus ID: 67693752
Presents corrections to the article, “Top-cited IEEE Journal of Solid-State Circuits papers,” (Sengupta, A. and Hodges, D.), IEEE…
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2016
2016
IEEE Journal of Solid State Circuits: The Evolution and Future of This Flagship Publication
T. Masuhara
IEEE Solid-State Circuits Magazine
2016
Corpus ID: 37474243
In 1966, the first and the second issues of IEEE Journal of Solid-State Circuits (JSSC) were published in September and December…
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2016
2016
Top-Cited IEEE Journal of Solid-State Circuits Papers
Abira Sengupta
,
D. Hodges
IEEE Solid-State Circuits Magazine
2016
Corpus ID: 8360552
To commemorate the 50th anniversary of IEEE Journal of Solid-State Circuits, the IEEE Solid-State Circuits Society has put…
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2016
2016
IEEE Journal of Solid-State Circuits Through the Years: From Its Beginnings in 1966 until 2016
D. Hodges
IEEE Solid-State Circuits Magazine
2016
Corpus ID: 7928196
Discusses the history, creation, mission, and scope of the IEEE Journal of Solid-State Circuits (JSSC). JSSC has documented the…
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Review
2016
Review
2016
IEEE Journal of Solid-State Circuits Best Paper Award Through the Years
Abira Sengupta
IEEE Solid-State Circuits Magazine
2016
Corpus ID: 42277184
Each year, the IEEE Journal of Solid-State Circuits Best Paper Award is presented to the authors of a paper that is considered by…
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2007
2007
Low energy RF transceiver design
B. Cook
2007
Corpus ID: 112170325
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee…
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Highly Cited
2007
Highly Cited
2007
An On-Chip NBTI Sensor for Measuring pMOS Threshold Voltage Degradation
J. Keane
,
T. T. Kim
,
C. Kim
IEEE Transactions on Very Large Scale Integration…
2007
Corpus ID: 2322367
Negative bias temperature instability (NBTI) is one of the most critical device reliability issues in sub-130 nm CMOS processes…
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Highly Cited
1996
Highly Cited
1996
Design issues in high performance floating point arithmetic units
S. Oberman
1996
Corpus ID: 16173495
In recent years computer applications have increased in their computational complexity. The industry-wide usage of performance…
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Highly Cited
1993
Highly Cited
1993
High-radix modular multiplication for cryptosystems
Peter Kornerup
Proceedings of IEEE 11th Symposium on Computer…
1993
Corpus ID: 5859414
Two algorithms for modular multiplication with very large moduli are analyzed specifically for their applicability when a high…
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1986
1986
Multiprocessor-Based Placement by Simulated Annealing
S. Kravitz
,
Rob A. Rutenbar
23rd ACM/IEEE Design Automation Conference
1986
Corpus ID: 17179375
Simulated annealing methods have proven to be particularly successful in physical design applications, but often require…
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