Skip to search form
Skip to main content
Skip to account menu
Semantic Scholar
Semantic Scholar's Logo
Search 227,741,292 papers from all fields of science
Search
Sign In
Create Free Account
Focused Ion Beam-Scanning Electron Microscope
Known as:
FIB-SEM
, FIB/SEM
An instrument that combines the use of a focused beam of gallium ions to etch or coat a sample with a scanning electron microscope to image the…
Expand
National Institutes of Health
Create Alert
Alert
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2019
2019
Novel characteristics of normal supraspinatus insertion in rats: an ultrastructural analysis using three-dimensional reconstruction using focused ion beam/scanning electron microscope tomography.
T. Kanazawa
,
M. Gotoh
,
K. Ohta
,
N. Shiba
,
Kei-ichiro Nakamura
Muscles Ligaments and Tendons Journal
2019
Corpus ID: 7916472
BACKGROUND the histological architecture of the insertion after a rotator cuff repair is completely different from that of normal…
Expand
2018
2018
Two novel approaches to study arthropod anatomy by using dualbeam FIB/SEM.
A. Di Giulio
,
M. Muzzi
Micron
2018
Corpus ID: 46829359
2016
2016
Two-scale analysis of a tight gas sandstone.
Yang Song
,
Catherine A. Davy
,
+4 authors
Pierre M. Adler
Physical Review E
2016
Corpus ID: 40025685
Tight gas sandstones are low porosity media, with a very small permeability (i.e., below 1 mD). Their porosity is below 10%, and…
Expand
2013
2013
Correlated SEM, FIB-SEM, TEM, and NanoSIMS Imaging of Microbes from the Hindgut of a Lower Termite: Methods for In Situ Functional and Ecological Studies of Uncultivable Microbes
K. Carpenter
,
P. Weber
,
M. Davisson
,
J. Pett‐Ridge
,
M. Haverty
,
P. Keeling
Microscopy and Microanalysis
2013
Corpus ID: 26160177
Abstract The hindguts of lower termites harbor highly diverse, endemic communities of symbiotic protists, bacteria, and archaea…
Expand
2013
2013
Internal composition of atmospheric dust particles from focused ion-beam scanning electron microscopy.
J. Conny
Environmental Science and Technology
2013
Corpus ID: 5480282
Use of focused ion-beam scanning electron microscopy (FIB-SEM) to investigate the internal composition of atmospheric particles…
Expand
2013
2013
Metal Nano-Grating Optimization for Higher Responsivity Plasmonic-Based GaAs Metal-Semiconductor-Metal Photodetector
A. Karar
,
C. Tan
,
K. Alameh
,
Y. T. Lee
,
F. Karouta
Journal of Lightwave Technology
2013
Corpus ID: 26349031
To improve the responsivity of the metal semiconductor metal photodetector (MSM-PD), we propose and demonstrate the use of sub…
Expand
2012
2012
Detection and speciation of brominated flame retardants in high‐impact polystyrene (HIPS) polymers
R. Holbrook
,
J. Davis
,
K. Scott
,
C. Szakal
Journal of Microscopy
2012
Corpus ID: 10240002
Polymeric materials have been suggested as possible environmental sources of persistent organic pollutants such as flame…
Expand
2010
2010
Taking a little off the top: nanorod array morphology and growth studied by focused ion beam tomography.
Kathleen M. Krause
,
D. Vick
,
M. Malac
,
M. Brett
Langmuir
2010
Corpus ID: 8844937
The high surface area, large aspect ratio, and porous nature of nanorod arrays make them excellent foundation materials for many…
Expand
2007
2007
Chemotrophic filamentous microfossils from the Hollard Mound (Devonian, Morocco) as investigated by focused ion beam.
B. Cavalazzi
Astrobiology
2007
Corpus ID: 44342951
The biologic origin of objects with microbe-like morphologies from the oldest preserved terrestrial sedimentary rocks remains a…
Expand
2006
2006
3D-Orientation Microscopy in a FIB SEM: A New Dimension of Microstructure Characterization
S. Zaefferer
Microscopy and Microanalysis
2006
Corpus ID: 135731881
Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9…
Expand
By clicking accept or continuing to use the site, you agree to the terms outlined in our
Privacy Policy
(opens in a new tab)
,
Terms of Service
(opens in a new tab)
, and
Dataset License
(opens in a new tab)
ACCEPT & CONTINUE