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Focused Ion Beam-Scanning Electron Microscope

Known as: FIB-SEM, FIB/SEM 
An instrument that combines the use of a focused beam of gallium ions to etch or coat a sample with a scanning electron microscope to image the… 
National Institutes of Health

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2018
2018
A unified deep-learning network to accurately segment insulin granules of different animal models imaged under different electron microscopy methodologies
Insulin is important for body metabolism regulation and glucose homeostasis, and its dysregulation often leads to metabolic… 
Review
2017
Review
2017
Porosity in Molecularly Imprinted Polymers via 3 D FIB / SEM Tomography
Please note that technical editing may introduce minor changes to the text and/or graphics, which may alter content. The journal… 
2016
2016
The evolution of uraninite, coffinite and brannerite from the Olympic Dam iron oxide-copper-gold-silveruranium deposit: linking textural observations to compositional variability
...................................................................................................... vi DECLARATION… 
2016
2016
Molecular organization and in situ assembly of the human skin barrier
A deficient skin barrier function is a characteristic feature of skin diseases such as eczema, psoriasis and the ichtyoses. A… 
2015
2015
The Effect of Microstructure On Transport Properties of Porous Electrodes
The Effect of Microstructure on Transport Properties of Porous Electrodes Serena Wen Peterson Department of Chemical Engineering… 
2015
2015
FIB/SEM Tomography of Wound Biofilm
Biofilm has a complex architecture and show high tolerance to host immune responses and antimicrobial agents [1]. Biofilm… 
2015
2015
Region of interest synchrotron nanotomography and nanodiffraction with FIB/SEM characterisation on engineering materials
The new Beam Lines of the Helmholtz-Zentrum Geesthacht (HZG, Germany) at the PETRA III storage ring at the Deutsche Elektronen… 
2009
2009
Quantification of Ni-YSZ Anode Microstructure Based on Dual Beam FIB-SEM Technique
Three-dimensional microstructure of a conventional Ni-8YSZ anode is quantified by means of dual beam FIB-SEM system equipped with… 
2006
2006
In Situ Lift-Out with a Focused-Ion-Beam/Scanning-Electron Microscope: A New Technique for Creating Transmission-Electron-Microscope Samples of Earth and Planetary Materials
Introduction: Information on crystal chemistry and structure is fundamental to understanding the chemical and physical processes… 
2004
2004
A low cost semiconductor metallization/planarization process
This paper presents an electrically-mediated process for copper metallization of semiconductor interconnect features. Compared to… 
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