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Failure cause

Known as: Component failure, Failure mechanisms, Mode of failure 
Failure causes are defects in design, process, quality, or part application, which are the underlying cause of a failure or which initiate a process… 
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Related topics

Related topics

15 relations
BucklingCascading failureCorner caseDebugging

Broader (1)

Failure

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2004
Highly Cited
2004
Models for Reliability Prediction of Fine-Pitch BGAs and CSPs in Shock and Drop-Impact
Drop-induced failures are most dominant in portable electronic products. In this study, explicit finite element models have been… 
Highly Cited
2004
Highly Cited
2004
Reliability prediction based on degradation modeling for systems with multiple degradation measures
This paper describes a general modeling and analysis approach for reliability prediction based on degradation modeling… 
Highly Cited
2003
Highly Cited
2003
Importance measures for noncoherent-system analysis
Component importance analysis is a key part of the system reliability quantification process. It enables the weakest areas of a… 
Highly Cited
2002
Highly Cited
2002
Dynamic Data Structures for a Direct Search Algorithm
The DIRECT (DIviding RECTangles) algorithm of Jones, Perttunen, and Stuckman (Journal of Optimization Theory and Applications… 
Review
1999
Review
1999
Design and development of a conformal load-bearing smart skin antenna: overview of the AFRL Smart Skin Structures Technology Demonstration (S3TD)
Documented herein is a review of progress for the recently completed 'Smart Skin Structure Technology Demonstration' (S3TD… 
Highly Cited
1998
Highly Cited
1998
Failure modes and effects analysis of complex engineering systems using functional models
Highly Cited
1986
Highly Cited
1986
Total-Dose Radiation and Annealing Studies: Implications for Hardness Assurance Testing
A series of experiments covering a wide range of dose rate, bias, and annealing conditions has been performed on CMOS test… 
Highly Cited
1985
Highly Cited
1985
Effect of System Workload on Operating System Reliability: A Study on IBM 3081
This paper presents an analysis of operating system failures on an IBM 3081 running VM/SP. We find three broad categories of… 
Highly Cited
1979
Highly Cited
1979
Conductive Anodic Filaments in Reinforced Polymeric Dielectrics: Formation and Prevention
The purpose of this paper is to report on a mode of failure observed during the life testing of epoxy-glass printed-circuit… 
Review
1978
Review
1978
Alpha particle tracks in silicon and their effect on dynamic MOS RAM reliability
Recent investigations have found low levels of alpha radiation (< .1 counts/cm2-hour) emitted from the immediate chip environment… 
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