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Failure cause

Known as: Component failure, Failure mechanisms, Mode of failure 
Failure causes are defects in design, process, quality, or part application, which are the underlying cause of a failure or which initiate a process… 
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Related topics

Related topics

15 relations
BucklingCascading failureCorner caseDebugging

Broader (1)

Failure

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2006
Highly Cited
2006
Solder-joint reliability in electronics under shock and vibration using explicit finite-element sub-modeling
In this paper, the modeling approaches for first-level solder interconnects in shock and drop of electronics assemblies have been… 
Highly Cited
2006
Highly Cited
2006
Reliability of CSP Interconnections Under Mechanical Shock Loading Conditions
Failure modes and mechanisms under mechanical shock loading were studied by employing the statistical and fractographic research… 
Highly Cited
2001
Highly Cited
2001
Blunt and sharp notch behaviour of Glare laminates
Glare laminates are materials that consist of alternating aluminium and glass prepreg layers especially designed for aeroplane… 
Highly Cited
2000
Highly Cited
2000
A case-based reasoning system for identifying failure mechanisms
Review
1999
Review
1999
Design and development of a conformal load-bearing smart skin antenna: overview of the AFRL Smart Skin Structures Technology Demonstration (S3TD)
Documented herein is a review of progress for the recently completed 'Smart Skin Structure Technology Demonstration' (S3TD… 
Highly Cited
1990
Highly Cited
1990
MECHANICAL FRACTURE-BEHAVIOR OF POLYACETAL AND THERMOPLASTIC POLYURETHANE ELASTOMER TOUGHENED POLYACETAL
Polyacetal (POM) toughening with thermoplastic polyurethane (TPU) elastomer was investigated in terms of Theological, mechanical… 
Highly Cited
1986
Highly Cited
1986
Gate metallization "Sinking" into the active channel in Ti/W/Au metallized power MESFET's
Commercial power MESFET's with Ti/W/Au gate metallization show a failure mode consisting of a decrease in Idssand Vpand an… 
Highly Cited
1981
Highly Cited
1981
Long-term and instantaneous burnout in GaAs power FET's: Mechanisms and solutions
Catastrophic source-drain burnout is an important failure mode in GaAs power FET's. In this paper we show that short-term… 
Review
1978
Review
1978
Alpha particle tracks in silicon and their effect on dynamic MOS RAM reliability
Recent investigations have found low levels of alpha radiation (< .1 counts/cm2-hour) emitted from the immediate chip environment… 
Review
1972
Review
1972
Failure criterion for brickwork in axial compression
The object of this thesis is to establish a failure criterion for brickwork in axial compression. Chapter 1 introduces the… 
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