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Evernote
Known as:
Scannable
Evernote is a cross-platform, freemium app designed for note taking, organizing, and archiving. It is developed by the Evernote Corporation, a…
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Android
BSD
BlackBerry 10
Browser extension
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Broader (1)
Data synchronization
Papers overview
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2014
2014
Evernote: A Tool for Educators
Eileen McNally
2014
Corpus ID: 61073682
Recommending a software suite called Evernote, the author assesses its security, flexibility, and ease of use for educators' many…
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2000
2000
Real-Time Disk Scheduling for Multimedia Applications with Deadline-Modification-Scan Scheme
R. Chang
,
W. Shih
,
R. Chang
Real-time systems
2000
Corpus ID: 1477810
Real-timedisk scheduling (RTDS) is important for time-critical multimediaapplications. In conventional approaches of real-time…
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1999
1999
Testability of the Philips 80C51 micro-controller
M. Konijnenburg
,
J. Th. van der Linden
,
A. J. van de Goor
International Test Conference . Proceedings (IEEE…
1999
Corpus ID: 28790784
This paper presents the research results of the sequential testability of the Philips 80C51 microcontroller. The motivations for…
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1998
1998
Test methodology for a microprocessor with partial scan
Leland L. Day
,
Paul A. Ganfield
,
Dennis M. Rickert
,
Fred J. Ziegler
Proceedings International Test Conference (IEEE…
1998
Corpus ID: 206678791
Microprocessors are incredibly complex devices that typically have many non-standard logic, array, and I/O structures. Testing of…
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1997
1997
Testing the 400 MHz IBM generation-4 CMOS chip
Thomas G. Foote
,
D. E. Hoffman
,
W. Huott
,
T. Koprowski
,
Bryan J. Robbins
,
M. P. Kusko
Proceedings International Test Conference
1997
Corpus ID: 6883561
This paper describes the design-for-test framework of the 400 MHz CMOS central processor (CP) used in the fourth generation (G4…
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1997
1997
High-level synthesis for orthogonal scan
Robert B. Norwood
,
E. McCluskey
Proceedings of the ... IEEE VLSI Test Symposium
1997
Corpus ID: 420270
Scan paths are commonly used in digital design to improve the testability of sequential circuits since a full scan path provides…
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1992
1992
ScanBist A Multi-frequency Scan-Based BIST Method
B. Nadeau-Dostie
,
D. Burek
,
A. Hassan
Proceedings International Test Conference
1992
Corpus ID: 13061949
This paper presents a BIST technique that allows the synchronization of multiple scan chains clocked at different frequencies…
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1992
1992
On the design of self-checking boundary scannable boards
Marcel 0 Lubaszewski
,
B. Courtois
Proceedings International Test Conference
1992
Corpus ID: 34787800
In this paper the Boundary Scan technique and the Un@ed Built-In Self-Test scheme are combined in order to propose a strategy…
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Highly Cited
1990
Highly Cited
1990
Expert systems applications in construction management and engineering
S. Mohan
1990
Corpus ID: 195714915
Because of their characteristic attributes of combining factual knowledge with judgment, being able to handle incomplete and…
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1989
1989
Prototype testing simplified by scannable buffers and latches
A. Halliday
,
G. Young
,
A. Crouch
Proceedings. 'Meeting the Tests of Time…
1989
Corpus ID: 39629253
Conventional logic devices incorporating boundary scan with the proposed IEEE P1149.1 interface have been shown to offer great…
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