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National Institutes of Health
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2011
2011
Cost-efficient built-in repair analysis for embedded memories with on-chip ECC
Hongbin Sun
,
Jizhong Zhao
,
Fei Wang
,
Nanning Zheng
,
Tong Zhang
International Service Availability Symposium
2011
Corpus ID: 7073833
This paper concerns low-cost implementation of built-in repair analysis (BIRA) for embedded memories. As embedded memories become…
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