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Black's equation

Known as: Black equation 
Black's Equation is a mathematical model for the mean time to failure (MTTF) of a semiconductor circuit due to electromigration: a phenomenon of… 
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Related topics

Related topics

2 relations
Electromigration

Broader (1)

Electronic design automation

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
Determination of safe reliability region over temperature and current density for through wafer vias
2017
2017
Thermo-electric coupling reliability model of copper pillar bump based on Black equation
In order to investigate the reliability of micro-interconnecting copper pillar bump under thermal-electric coupling, the test… 
2016
2016
Voltage-based electromigration immortality check for general multi-branch interconnects
As VLSI technology features are pushed to the limit with every generation and with the introduction of new materials and… 
2011
2011
Analysis of critical-length data from Electromigration failure studies
  • V. Dwyer
  • Microelectronics and reliability
  • 2011
  • Corpus ID: 27096642
2011
2011
Black's equation for today's ULSI interconnect Electromigration reliability — A revisit
  • Wei LiC. Tan
  • IEEE International Conference of Electron Devices…
  • 2011
  • Corpus ID: 20223701
Electromigration (EM) is an important failure mechanism in Ultra-Large-Scale Integration (ULSI) interconnections. The Black's… 
Review
2010
Review
2010
Physically based models of electromigration: From Black's equation to modern TCAD models
2008
2008
Effects of length scaling on electromigration in dual-damascene copper interconnects
2005
2005
Lead-Free and PbSn Bump Electromigration Testing
As the electronics industry continues to push for miniaturization, several reliability factors become vital issues. The demand… 
1999
1999
Temperature gradient effects in electromigration using an extended transition probability model and temperature gradient free tests. I. Transition probability model
Temperature gradient effects incorporated in electromigration are examined via the movement of vacancies. To explain the movement… 
1979
1979
Job Change Behavior in the Rural Income Maintenance Experiment. Institute for Research on Poverty Discussion Papers.
kindly commented on an earlier draft. A considerable debt is owed to Professor Seymour Spi1erman for the· gUidance provided by a… 
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