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Black's equation

Known as: Black equation 
Black's Equation is a mathematical model for the mean time to failure (MTTF) of a semiconductor circuit due to electromigration: a phenomenon of… 
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Papers overview

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2018
2018
Due to the resistance of metal wires in power grid network, voltage drop noise occurs in the form of IR drop which may change the… 
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2017
2017
In order to investigate the reliability of micro-interconnecting copper pillar bump under thermal-electric coupling, the test… 
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2011
2011
  • V. Dwyer
  • Microelectron. Reliab.
  • 2011
  • Corpus ID: 27096642
Abstract An accurate estimation of the Blech length, the critical line length below which interconnect lines are immortal, is… 
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2011
2011
  • W. Li, C. Tan
  • IEEE International Conference of Electron Devices…
  • 2011
  • Corpus ID: 20223701
Electromigration (EM) is an important failure mechanism in Ultra-Large-Scale Integration (ULSI) interconnections. The Black's… 
Review
2010
Review
2010
Electromigration failure is a major reliability concern for integrated circuits. The continuous shrinking of metal line… 
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2008
2008
Abstract The electromigration short-length effect in dual-damascene Cu interconnects has been investigated through experiments on… 
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2005
2005
As the electronics industry continues to push for miniaturization, several reliability factors become vital issues. The demand… 
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Highly Cited
2005
Highly Cited
2005
Reliability of interconnect via is increasing an important issue in submicron technology. Electromigration experiments are… 
1999
1999
Temperature gradient effects incorporated in electromigration are examined via the movement of vacancies. To explain the movement… 
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1979
1979
kindly commented on an earlier draft. A considerable debt is owed to Professor Seymour Spi1erman for the· gUidance provided by a… 
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