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Black's equation

Known as: Black equation 
Black's Equation is a mathematical model for the mean time to failure (MTTF) of a semiconductor circuit due to electromigration: a phenomenon of… 
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Papers overview

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2017
2017
In order to investigate the reliability of micro-interconnecting copper pillar bump under thermal-electric coupling, the test… 
2016
2016
As VLSI technology features are pushed to the limit with every generation and with the introduction of new materials and… 
2011
2011
  • V. Dwyer
  • Microelectronics and reliability
  • 2011
  • Corpus ID: 27096642
2011
2011
  • Wei LiC. Tan
  • IEEE International Conference of Electron Devices…
  • 2011
  • Corpus ID: 20223701
Electromigration (EM) is an important failure mechanism in Ultra-Large-Scale Integration (ULSI) interconnections. The Black's… 
Review
2010
2005
2005
As the electronics industry continues to push for miniaturization, several reliability factors become vital issues. The demand… 
1999
1999
Temperature gradient effects incorporated in electromigration are examined via the movement of vacancies. To explain the movement… 
1979
1979
kindly commented on an earlier draft. A considerable debt is owed to Professor Seymour Spi1erman for the· gUidance provided by a…