GexSi1−x/Si strained‐layer superlattice grown by molecular beam epitaxy
- J. BeanL. FeldmanA. FioryS. NakaharaI. Robinson
- 1 April 1984
Materials Science, Physics
Ge x Si1−x films are grown on Si by molecular beam epitaxy and analyzed by Nomarski optical interferencemicroscopy, Rutherford ion backscattering and channeling, x‐ray diffraction, and transmission…
Critical-exponent measurements of a two-dimensional superconductor
Voltage-current (V-I) measurements of an amorphous indium/ p indium oxide thin-film composite have yielded values for the exponent eta(T) describing the power-law decay of the order-parameter…
Pseudomorphic growth of GexSi1−x on silicon by molecular beam epitaxy
- J. BeanT. T. ShengL. FeldmanA. FioryR. T. Lynch
- 1984
Materials Science, Physics
GexSi1−x layers are grown on Si substrates over the full range of alloy compositions at temperatures from 400–750 °C by means of molecular beam epitaxy. At a given growth temperature films grow in a…
Theory of high-TC superconductivity: transition temperature
- D. R. HarshmanA. FioryJ. Dow
- 22 December 2010
Physics
It is demonstrated that the transition temperature (TC) of high-TC superconductors is determined by their layered crystal structure, bond lengths, valency properties of the ions, and Coulomb coupling…
50 nm Vertical Replacement-Gate (VRG) pMOSFETs
- S. OhJ. Hergenrother J. Plummer
- 2000
Engineering, Materials Science
International Electron Devices Meeting 2000…
We present the first p-channel Vertical Replacement-Gate (VRG) MOSFETs. Like the VRG-nMOSFETs demonstrated last year, these devices show promise as a successor to planar MOSFETs for highly-scaled…
Novel MEMS Fabry-Perot Interferometric Pressure Sensors
- I. PadrónA. FioryN. Ravindra
- 12 January 2010
Materials Science, Engineering
A novel design for a Fabry-Perot Interferometric Sensor (FPIS) consisting of a Fabry-Perot cavity formed between two bonded surfaces is discussed. The Fabry-Perot cavity and the optical fiber to…
Light emission from silicon: Some perspectives and applications
- A. FioryN. Ravindra
- 1 October 2003
Engineering, Physics
Research on efficient light emission from silicon devices is moving toward leading-edge advances in components for nano-optoelectronics and related areas. A silicon laser is being eagerly sought and…
50 nm vertical replacement-gate (VRG) nMOSFETs with ALD HfO2 and Al2O3 gate dielectrics
- J. HergenrotherG. Wilk C. Werkhoven
- 1 December 2001
Engineering, Materials Science
High-TC Superconductivity in Hydrogen Clathrates Mediated by Coulomb Interactions Between Hydrogen and Central-Atom Electrons
- D. R. HarshmanA. Fiory
- 17 June 2020
Physics
The uniquely characteristic macrostructures of binary hydrogen-clathrate compounds MHn formed at high pressure, a cage of hydrogens surrounding a central-atom host, is theoretically predicted in…
Effect of ramp rates during rapid thermal annealing of ion implanted boron for formation of ultra-shallow junctions
- A. AgarwalH. GossmannA. Fiory
- 1 December 1999
Engineering, Materials Science
Over the last couple of years, manufacturers of rapid thermal annealing (RTA) equipment have been aggressively developing lamp-based furnaces capable of achieving ramp-up rates of the order of…
...
...