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Window detector
Known as:
Window comparator
A window detector circuit, also called window comparator circuit or dual edge limit detector circuits is used to determine whether an unknown input…
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Related topics
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2010
2010
Low-Noise Analog ASIC for Silicon and CdTe Sensors
T. Kishishita
,
G. Sato
,
H. Ikeda
,
T. Takahashi
,
T. Kiyuna
,
Y. Mito
IEEE Transactions on Nuclear Science
2010
Corpus ID: 8236445
We report on the recent development of a 32-channel low-noise analog front-end ASIC "KW03" for hard X-ray and gamma-ray detectors…
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2007
2007
Particle Swarm Optimisation for Operational Planning: Unit Commitment and Economic Dispatch
P. Sriyanyong
,
Y. Song
,
P. Turner
Evolutionary Scheduling
2007
Corpus ID: 8596008
2006
2006
Design of window comparators for integrator-based capacitor array testing circuits
A. Laknaur
,
Haibo Wang
IEEE International Symposium on Quality…
2006
Corpus ID: 16610715
This paper investigates the impact of window comparator threshold variations on the performance of integrator-based programmable…
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2003
2003
Cover Sheet Title : Experimental Realization of Controlling Chaos in the Periodically Switched Nonlinear Circuit
Yosihito Yasuhara
,
T. Ueta
,
H. Kawakami
2003
Corpus ID: 21378582
This letter presents an experimental confirmation of controlling the chaotic behavior to a target unstable periodic orbit when…
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2003
2003
Self-positioning digital window comparators for mixed-signal DfT
D. Venuto
,
M. Ohletz
,
B. Riccò
EFTA . IEEE Conference on Emerging Technologies…
2003
Corpus ID: 10518323
The use of simple digital window comparators for the on-chip evaluation of analogue signals is described. It is shown that a…
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1999
1999
On-line BIST for testing analog circuits
Jaime Velasco-Medina
,
I. Rayane
,
M. Nicolaidis
Proceedings IEEE International Conference on…
1999
Corpus ID: 34197371
In this paper, we present a new online built-in self-test (BIST) approach for testing analog circuits. It uses a current window…
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1999
1999
AC/DC BIST for testing analog circuits
J. Velasco-Medina
,
I. Rayane
,
M. Nicolaidis
Twelfth Annual IEEE International ASIC/SOC…
1999
Corpus ID: 60871400
In this paper, we present a new BIST approach for testing analog circuits. It uses current window comparator and current-based…
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1994
1994
High precision voltage-to-frequency converter
S. Cai
,
I. Filanovsky
Proceedings of 37th Midwest Symposium on…
1994
Corpus ID: 17514919
A bipolar high precision voltage-to-frequency converter is described. The circuit includes an input voltage-to-current conversion…
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1993
1993
Design of concurrent error detectable current-mode A/D converters for real-time applications
C. Wey
,
S. Krishnan
,
S. Sahli
1993
Corpus ID: 62165389
Analog MOS circuits are becoming increasingly sophisticated in terms of checking and correcting themselves. Self-correcting, self…
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1989
1989
Digital phase-locked loop with jitter bounded
S. M. Walters
,
T. Troudet
1989
Corpus ID: 110862442
A design of an all-digital phase-locked loop (DPLL) with direct frequency synthesis is proposed for generating signals that…
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