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White-box testing
Known as:
Whitebox testing
, Glass-box testing
, White box test
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White-box testing (also known as clear box testing, glass box testing, transparent box testing, and structural testing) is a method of testing…
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Related topics
Related topics
26 relations
Axiomatic product development lifecycle
Basis path testing
Black-box testing
Code coverage
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
Review
2013
Review
2013
Recent advances in small molecular, non-polymeric organic hole transporting materials for solid-state DSSC
Thanh‐Tuân Bui
,
F. Goubard
2013
Corpus ID: 54736452
Issue from thin-film technologies, dye-sensitized solar cells have become one of the most promising technologies in the field of…
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2011
2011
XML-manipulating test case prioritization for XML-manipulating services
Lijun Mei
,
W. Chan
,
T. Tse
,
Robert G. Merkel
Journal of Systems and Software
2011
Corpus ID: 15628548
2009
2009
Comparison of Two Fitness Functions for GA-Based Path-Oriented Test Data Generation
Yong Chen
,
Yong Zhong
,
Tingting Shi
,
Jingyong Liu
Fifth International Conference on Natural…
2009
Corpus ID: 37352290
Automatic path-oriented test data generation is not only a crucial problem but also a hot issue in the research area of software…
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2008
2008
Integrating Component Tests to System Tests
B. Schätz
,
C. Pfaller
International Workshop on Formal Aspects of…
2008
Corpus ID: 17964991
2008
2008
Using model-checkers to generate and analyze property relevant test-cases
G. Fraser
,
F. Wotawa
Software quality journal
2008
Corpus ID: 7452746
Verification is applied to software as a proof method with respect to its requirements. Software testing is necessary because…
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2007
2007
White Box Pairwise Test Case Generation
Jangbok Kim
,
Kyunghee Choi
,
D. Hoffman
,
Gihyun Jung
International Conference on Quality Software
2007
Corpus ID: 2636230
Pairwise testing is an intuitive approach to test case generation, and has already seen use in commercial tools and practical…
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2003
2003
On structural vs. functional testing for delay faults
Angela Krstic
,
J. Liou
,
K. Cheng
,
Li-C. Wang
Fourth International Symposium on Quality…
2003
Corpus ID: 2238134
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing…
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2000
2000
Different experiments in test generation for XILINX FPGAs
M. Renovell
,
Y. Zorian
Proceedings International Test Conference (IEEE…
2000
Corpus ID: 11062287
In this paper, we describe an experiment about structural testing of two XILINX FPGAs families. In our practical approach, the…
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Highly Cited
1997
Highly Cited
1997
Oscillation built-in self test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits
Karim Arabi
,
B. Kaminska
Proceedings International Test Conference
1997
Corpus ID: 206678561
This paper describes a new built-in self test (BIST) technique suitable for both functional and structural testing of analog and…
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Highly Cited
1992
Highly Cited
1992
An empirical evaluation (and specification) of the all-du-paths testing criterion
J. Bieman
,
J. Schultz
Software Engineering Journal
1992
Corpus ID: 29729096
The all-du-paths structural testing criterion is one of the most discriminating of the data-flow testing criteria. Unfortunately…
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