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Test strategy
A test strategy is an outline that describes the testing approach of the software development cycle. It is created to inform project managers…
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Related topics
Related topics
12 relations
ISO/IEC 29119
Integration testing
Performance engineering
Risk-based testing
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2009
2009
Defect-based analog fault coverage analysis using mixed-mode fault simulation
J. Parky
,
Srinadh Madhavapeddiz
,
Alessandro Paglieri
,
Chris Barrz
,
Jacob A. Abrahamy
IEEE 15th International Mixed-Signals, Sensors…
2009
Corpus ID: 39590140
A fault coverage analysis has become an important tool to evaluate the testability of developing circuits and to come up with an…
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2007
2007
SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving
Le Jin
,
Degang Chen
,
R. Geiger
IEEE Transactions on Instrumentation and…
2007
Corpus ID: 1158002
This paper describes an approach for analog-to-digital converter (ADC) linearity testing that can tolerate environmental…
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Highly Cited
2007
Highly Cited
2007
On a Dynamical System with Multiple Chaotic attractors
Xiaodong Luo
,
M. Small
,
Marius-F. Danca
,
Guanrong Chen
International Journal of Bifurcation and Chaos in…
2007
Corpus ID: 26341015
The chaotic behavior of the Rabinovich–Fabrikant system, a model with multiple topologically different chaotic attractors, is…
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2007
2007
Estimating Error Rate in Defective Logic Using Signature Analysis
Z. Pan
,
M. Breuer
IEEE transactions on computers
2007
Corpus ID: 8558987
As feature size approaches molecular dimensions and the number of devices per chip reaches astronomical values, VLSI…
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2006
2006
Alternate electrical tests for extracting mechanical parameters of MEMS accelerometer sensors
Vishwanath Natarajan
,
S. Bhattacharya
,
A. Chatterjee
IEEE VLSI Test Symposium
2006
Corpus ID: 2601902
Recent advances in thin film micromachining techniques have spurred a new generation of smart systems incorporating…
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2005
2005
A design and test technique for embedded software
Byeongdo Kang
,
Young-Jik Kwon
,
R. Lee
International Conference on Software Engineering…
2005
Corpus ID: 16997110
In recent years, embedded systems have become so complex and the development time to market is required to be shorter than before…
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2004
2004
Parallel test reduces cost of test more effectively than just a cheap tester
Jochen Rivoir
IEEE/CPMT/SEMI 29th International Electronics…
2004
Corpus ID: 42304736
Today's manufacturers of high-volume consumer devices are under tremendous cost pressure and consequently under extreme pressure…
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2002
2002
Adapting an SoC to ATE concurrent test capabilities
R. Dorsch
,
Ramón Huerta Rivera
,
H. Wunderlich
,
Martin Fischer
Proceedings. International Test Conference
2002
Corpus ID: 16129573
Concurrent test features are available in SoC testers to increase ATE throughput. To exploit these new features, design…
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Highly Cited
1996
Highly Cited
1996
Oscillation-test strategy for analog and mixed-signal integrated circuits
Karim Arabi
,
B. Kaminska
Proceedings of 14th VLSI Test Symposium
1996
Corpus ID: 11494318
A new low-cost test method for analog integrated circuits, called oscillation-test, is presented. During the test mode, the…
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1995
1995
An object-oriented expert system for fault diagnosis in the ethylene distillation process
D. Batanov
,
Zhuang Cheng
1995
Corpus ID: 62392709
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