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Test-and-set
Known as:
Test and set
, Test&set
In computer science, the test-and-set instruction is an instruction used to write to a memory location and return its old value as a single atomic (i…
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Related topics
Related topics
24 relations
Atomicity (database systems)
Busy waiting
Central processing unit
Compare-and-swap
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Broader (1)
Concurrency control
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2014
2014
Low power hydrometry for open channel flows
Zahoor Ahmad
,
Abubakr Muhammad
Annual Conference of the IEEE Industrial…
2014
Corpus ID: 3554887
Inspired by the need to monitor and control the world's largest irrigation and river networks such as those in the Indus River…
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2013
2013
Unwrapping the eye for visible-spectrum gaze tracking on wearable devices
B. Pires
,
Michael Devyver
,
Akihiro Tsukada
,
T. Kanade
IEEE Workshop on Applications of Computer Vision…
2013
Corpus ID: 9435185
Wearable devices with gaze tracking can assist users in many daily-life tasks. When used for extended periods of time, it is…
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2008
2008
Inter-PAN Mobility Support for 6LoWPAN
G. Bag
,
Hamid Mukhtar
,
S.M.S. Shams
,
Ki-Hyung Kim
,
S. Yoo
Third International Conference on Convergence and…
2008
Corpus ID: 14680989
This paper proposes Inter PAN mobility support for 6LoWPANs moving within an IP domain. In order to reduce the processing and…
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2008
2008
Precedence-type tests based on record values
N. Balakrishnan
,
A. Dembińska
,
A. Stepanov
2008
Corpus ID: 123333374
Precedence-type tests based on order statistics are simple and efficient nonparametric tests that are very useful in the context…
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2004
2004
Transmission line pulse test methods, test techniques and characterization of low capacitance voltage suppression device for system level electrostatic discharge compliance
K. Shrier
,
T. Truong
,
J. Felps
Electrical Overstress/Electrostatic Discharge…
2004
Corpus ID: 40284778
Voltage suppression devices are needed in electronic systems to prevent damage to electrical components from electrical…
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2004
2004
A learning system for the problem of mutual exclusion in multithreaded programming
Eisuke Yoshida
,
H. Kakugawa
IEEE International Conference on Advanced…
2004
Corpus ID: 23052693
In this paper, we propose a GUI-based learning system for the problem of mutual exclusion in multithreaded programming (MTP) such…
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2003
2003
Distributed-sum termination detection supporting multithreaded execution
Y. Tseng
,
R. Demara
,
P. J. Wilder
Parallel Computing
2003
Corpus ID: 13231306
1994
1994
On compacting test sets by addition and removal of test vectors
S. Kajihara
,
I. Pomeranz
,
K. Kinoshita
,
S. Reddy
Proceedings of the ... IEEE VLSI Test Symposium
1994
Corpus ID: 5472071
This paper presents a method of test compaction for stuck-at faults in combinational circuits, that complements previously…
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1993
1993
Using Formal Methods To Mechanize Category-Partition Testing
P. Ammann
,
Je O Utt
1993
Corpus ID: 17909100
We extend the category-partition method, a speci cation-based method for testing software. Previous work in category-partition…
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1992
1992
Nested Actions in Eos
Laurent Daynès
,
O. Gruber
Workshop on Persistent Objects
1992
Corpus ID: 3076048
Persistent and distributed object systems have to cope with chaos resulting of concurrent accesses and failures. This suggests…
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