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Static random-access memory

Known as: RSNM, S-RAM, SRAM latency 
Static random-access memory (static RAM or SRAM) is a type of semiconductor memory that uses bistable latching circuitry (flip-flop) to store each… 
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Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2013
Highly Cited
2013
Electron-Induced Single-Event Upsets in Static Random Access Memory
We present experimental evidence of single-event upsets in 28 and 45 nm CMOS SRAMs produced by single energetic electrons. Upsets… 
Highly Cited
2008
Highly Cited
2008
A 256 kb 65 nm 8T Subthreshold SRAM Employing Sense-Amplifier Redundancy
Aggressively scaling the supply voltage of SRAMs greatly minimizes their active and leakage power, a dominating portion of the… 
2006
2006
NMOS/SiGe Resonant Interband Tunneling Diode Static Random Access Memory
Tunneling-based static random access memory(SRAM)has been sought as a viable solution for a lowpower and high speed embedded… 
Highly Cited
2005
Highly Cited
2005
6 nm half-pitch lines and 0.04 µm2 static random access memory patterns by nanoimprint lithography
A key issue in nanoimprint lithography (NIL) is determining the ultimate pitch resolution achievable for various pattern shapes… 
Highly Cited
2004
Highly Cited
2004
A public-key infrastructure for key distribution in TinyOS based on elliptic curve cryptography
We present the first known implementation of elliptic curve cryptography over F/sub 2p/ for sensor networks based on the 8-bit, 7… 
Highly Cited
2003
Highly Cited
2003
Magnetically engineered spintronic sensors and memory
The discovery of enhanced magnetoresistance and oscillatory interlayer exchange coupling in transition metal multilayers just… 
1997
1997
Static random access memory
Kind of static random access memory, comprising: a substrate; a pair of driving transistors cross-connected are formed on a… 
Highly Cited
1990
Highly Cited
1990
A realistic fault model and test algorithms for static random access memories
Testing static random access memories (SRAMs) for all possible failures is not feasible and one must restrict the class of faults… 
Highly Cited
1988
Highly Cited
1988
Fault modeling and test algorithm development for static random access memories
A fault model for SRAMs (static random-access memories) is presented based on physical spot defects, which are modeled as local… 
1988
1988
A realistic self-test machine for static random access memories
A self-test machine for static random access memories (SRAMs) has been developed. It is capable of running linear test algorithms… 
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