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Standard test image

Known as: Test image 
A standard test image is a digital image file used across different institutions to test image processing and image compression algorithms. By using… 
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Related topics

Related topics

9 relations
Digital image processingFERET databaseImage compressionImage processing

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2012
Highly Cited
2012
A hierarchical approach for human age estimation
We consider the problem of automatic age estimation from face images. Age estimation is usually formulated as a regression… 
2011
2011
Multi-scale Sparse Representation for Robust Face Recognition
Recently the Sparse Representation-based Classification (SRC) has been successfully used in face recognition. In SRC, a test… 
2009
2009
Adaptive color image watermarking based on a modified improved pixel-wise masking technique
2005
2005
MINACE filter classification algorithms for ATR using MSTAR data
A synthetic aperture radar (SAR) automatic target recognition (ATR) system based on the minimum noise and correlation energy… 
Highly Cited
1999
Highly Cited
1999
X-ray imaging using lead iodide as a semiconductor detector
The x-ray imaging performance is reported using polycrystalline lead iodide as a thick semiconductor detector on an active matrix… 
1997
1997
Estimation and Compensation of Subpixel Edge Localization Error
We propose and analyze a method for improving the performance of subpixel edge localization (EL) techniques through compensation… 
Highly Cited
1995
Highly Cited
1995
Single-View Based Recognition of Faces Rotated in Depth
We present a method for recognizing objects (faces) on the basis of just one stored view, in spite of rotation in depth. The… 
1992
1992
On the JPEG model for lossless image compression
The JPEG lossless arithmetic coding algorithm and a predecessor algorithm called Sunset both employ adaptive arithmetic coding… 
1990
1990
A quantitative comparison of edge-preserving smoothing techniques
Highly Cited
1985
Highly Cited
1985
Novel method for analysis of printed circuit images
To keep pace with the trend towards increased circuit integration, printed circuit patterns are becoming denser and more complex… 
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