Skip to search form
Skip to main content
Skip to account menu
Semantic Scholar
Semantic Scholar's Logo
Search 228,397,753 papers from all fields of science
Search
Sign In
Create Free Account
Silicon Systems
Known as:
Silicon Systems Inc.
Silicon Systems Inc. (SSi) (not to be confused with SiliconSystems, Inc.) was an American semiconductor company based in Tustin, California. The…
Expand
Wikipedia
(opens in a new tab)
Create Alert
Alert
Related topics
Related topics
14 relations
Computer data storage
Dual-tone multi-frequency signaling
Microcontroller
Mixed-signal integrated circuit
Expand
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2019
2019
Random Finite Sets Based Very Short-Term Solar Power Forecasting Through Cloud Tracking
F. Barbieri
2019
Corpus ID: 214497492
2017
2017
Thermo-mechanical modeling and parametric analysis of lithium-ion battery
Abhishek Sarkar
2017
Corpus ID: 52830460
Lithium-ion battery electrodes tend to fracture due to extensive mechanical stress and/or thermally fail by due to overheating…
Expand
2013
2013
Étude de matériaux composites à base de nanosiliciures de métaux de transition pour la thermoélectricité
Katia Favier
2013
Corpus ID: 91302266
L'alliage Si-Ge est utilise depuis de nombreuses annees dans les modules thermoelectriques dans les sondes spatiales de la NASA…
Expand
2013
2013
Searching for Theory in Metadata
Ben Li
2013
Corpus ID: 54084058
This paper argues to include descriptions of theories alongside metadata descriptions of data. It compares several metadata…
Expand
2012
2012
Biological and Bioactive Silicon Systems
Siddharth V. Patwardhan
,
S. J. Clarson
Silicon
2012
Corpus ID: 96259742
We open this special issue of SILICON with a preface and some observations on Biological and Bioactive Silicon Systems by the…
Expand
2006
2006
Development of Large Area Integrated Silicon Tracking Elements for the LHC Luminosity Upgrade
K. Baker
,
R. Ely
,
+11 authors
M. Weber
IEEE Nuclear Science Symposium Conference Record
2006
Corpus ID: 11803447
2000
2000
Role of buried ultra thin interlayer silicide on the growth of Ni film on Si(100) substrate
D. Sarkar
,
M. Falke
,
H. Giesler
,
S. Teichert
,
G. Beddies
,
H. Hinneberg
2000
Corpus ID: 92983094
Abstract.The presence of a buried, ultra-thin amorphous interlayer in the interface of room temperature deposited Ni film with a…
Expand
2000
2000
Advanced Statistical Tools for Improving Yield and Reliability
R. Kittler
2000
Corpus ID: 14512894
Analysis of manufacturing data as a tool for failure analysts often meets with roadblocks due to the complex non-linear behaviors…
Expand
1998
1998
Testing DSP cores based on self-test programs
Wei Zhao
,
C. Papachristou
Proceedings Design, Automation and Test in Europe
1998
Corpus ID: 8917029
This paper presents a new method for the testing of the datapath of DSP cores based on self-test program. During the test, random…
Expand
1998
1998
Determination of the bonding qualities of layered gold/silicon systems using higher SAW modes
T. Blum
,
K. Kosbi
,
U. Scheer
,
S. Boseck
Other Conferences
1998
Corpus ID: 135655203
Dispersion curves of SAWs propagating on the surface of a layered system wee obtained by measurement of the surface wave…
Expand
By clicking accept or continuing to use the site, you agree to the terms outlined in our
Privacy Policy
(opens in a new tab)
,
Terms of Service
(opens in a new tab)
, and
Dataset License
(opens in a new tab)
ACCEPT & CONTINUE