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Scanning mobility particle sizer
Known as:
SMPS
A scanning mobility particle sizer (SMPS) is an analytical instrument that measures the size and number concentration of aerosol particles with…
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Related topics
Related topics
2 relations
Optical spectrometer
Broader (1)
Signal processing
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
Conducted-emission modeling for a switched-mode power supply (SMPS)
Yansheng Wang
,
S. Bai
,
+6 authors
Jun Fan
IEEE Symposium on Electromagnetic Compatibility…
2015
Corpus ID: 24429607
This paper is focused on the construction of a conducted-emission model for a switched-mode power supply (SMPS). First, the total…
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2013
2013
Vertical Noise Coupling From On-Chip Switching-Mode Power Supply in a Mixed-Signal Stacked 3-D-IC
Kyoungchoul Koo
,
Myunghoi Kim
,
Jonghoon J. Kim
,
Joungho Kim
,
Jiseong Kim
IEEE Transactions on Components, Packaging, and…
2013
Corpus ID: 7389256
In this paper, we propose a fast and accurate model of the vertical noise coupling from an on-chip switching-mode power supply…
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2013
2013
Radiated emission determination from near field measurements for EMI evaluation of switch mode power supplies components by method of moments
S. Mirtalaei
,
S. Sadeghi
,
R. Moini
4th Annual International Power Electronics, Drive…
2013
Corpus ID: 25097966
Currently most of the electrical and electronic equipments use switching mode power supplies (SMPS) as their input power source…
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Review
2013
Review
2013
Multi-parametric reference nanomaterials for toxicology: state of the art, future challenges and potential candidates
G. Orts-Gil
,
Kishore Natte
,
W. Österle
2013
Corpus ID: 97789563
A major requirement for the validation of methods assessing the risk associated with engineered nanoparticles (ENPs) is the use…
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2012
2012
Scanning Mobility Particle Sizer: Fast data Inversion and uncertainty analysis
L. Coquelin
,
N. Fischer
,
+5 authors
L. Brusquet
2012
Corpus ID: 125786047
HAL is a multi-disciplinary open access archive for the deposit and dissemination of scientific research documents, whether they…
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2011
2011
Application of Double Layer Frequency Selective Surface for SMPS shielding
T. R. S. Kumar
,
C. Venkatesh
IEEE International Symposium on Electromagnetic…
2011
Corpus ID: 23685023
While designing the metallic enclosure for the electromagnetic shielding of electronic circuits, apertures on the enclosure walls…
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2009
2009
Slurry Abrasive Particle Size Measurement by Scanning Mobility Particle Sizer
Hojoong Kim
,
Ji Chul Yang
,
Taesung Kim
2009
Corpus ID: 138060126
Abrasive particle size of CMP slurry is known as one of the key design parameters to control the defect level during CMP process…
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2005
2005
An Evaluation Of A Scanning Mobility Particles Sizer With NIST-Traceable Particle Size Standards
J. Vasiliou
2005
Corpus ID: 55115742
A scanning mobility particle sizer (SMPS -- TSI Model 3936-Series) was evaluated using Duke Scientific NISTtraceable particle…
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2005
2005
Eddy current losses in SMPS transformers round wire windings: a semi-analytical closed-form formula
F. Robert
,
J. Sprooten
,
P. Mathys
,
J.-P. Schauwers
,
B. Velaerts
EPE
2005
Corpus ID: 1221755
We provide a new closed-form formula that instantly calculates the 2D high-frequency ohmic losses (skin and proximity effects) in…
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Highly Cited
2004
Highly Cited
2004
Performance Evaluation of a Novel Sampling and Measurement System for Exhaust Particle Characterization
L. Ntziachristos
,
B. Giechaskiel
,
+9 authors
R. Vogt
2004
Corpus ID: 58931391
This paper presents a novel partial flow sampling system for the characterization of airborne exhaust particle emissions. The…
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