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Roughness length
Roughness length () is a parameter of some vertical wind profile equations that model the horizontal mean wind speed near the ground; in the log wind…
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4 relations
Broader (1)
Atmospheric dispersion modeling
Log wind profile
Outline of air pollution dispersion
Wind profile power law
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
30-year mesoscale model simulations for the “Noise from wind turbines and risk of cardiovascular disease” project
Alfredo Pena Diaz
,
A. Hahmann
2017
Corpus ID: 133226815
max. 2000 char) This report documents the work performed by DTU Wind Energy for the project “Noise from wind turbines and risk of…
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2016
2016
Reprint of: Active subspaces for sensitivity analysis and dimension reduction of an integrated hydrologic model
J. Jefferson
,
J. M. Gilbert
,
P. Constantine
,
R. Maxwell
Computational Geosciences
2016
Corpus ID: 40171795
2012
2012
MORPHODYNAMICS OF A CARIBBEAN BEACH FRINGED BY A CORAL REEF
A. R. D. Alegría-Arzaburu
,
I. Mariño‐Tapia
,
C. Enriquez
,
R. Silva-Casarín
,
M. González-Leija
2012
Corpus ID: 73632553
The morphological response of two adjacent beaches, on the Mexican Caribbean coast, exposed to the same offshore wave climate is…
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2012
2012
Scale interactions in an urban-like boundary layer : a wind tunnel study
Cédric Rivet
2012
Corpus ID: 134138876
The aim of the present study is to elucidate the spatio-temporal interactions between the atmospheric boundary layer and the flow…
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2010
2010
Flume investigation of the effects of sub-threshold rising flows on the entrainment of gravel beds
M. Piedra
2010
Corpus ID: 129675243
Recent research on sediment transport in gravel bed rivers shows evidence of the influence of sub-threshold flow history on…
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2008
2008
Impact of HBr and Ar cure plasma treatments on 193nm photoresists
A. Bazin
,
E. Pargon
,
X. Mellhaoui
,
D. Perret
,
B. Mortini
,
O. Joubert
SPIE Advanced Lithography
2008
Corpus ID: 122742590
Since they have been introduced to substitute poly(hydroxystyrene) based 248nm photoresists (PR), 193nm photoresists based on…
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2008
2008
A NEW METHOD TO EXTRACT THE POLARIMETRIC PARAMETERS IN IMAGING RADARS
B. Zakeri
,
A. Ghorbani
,
H. A. Davar
2008
Corpus ID: 55708682
In this paper, a statistical approach to evaluate randomly rough surfaces (RRS) in an inverse scattering problem is presented…
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2007
2007
Wind Direction Dependence of Atmospheric Boundary Layer Turbulence Parameters in the Urban Roughness Sublayer
C. Klipp
2007
Corpus ID: 54843074
Abstract A variety of atmospheric boundary layer parameters are examined as a function of wind direction in both urban and…
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2007
2007
Wind Tunnel Investigations of Boundary Layer Conditions Before and During Snow Drift
A. Clifton
2007
Corpus ID: 130599044
1
2003
2003
Intel's EUV resist development
H. Cao
,
J. Roberts
,
+5 authors
B. Rice
SPIE Advanced Lithography
2003
Corpus ID: 137655331
The success of extreme ultraviolet (EUV) lithography depends upon developing resists that meet the patterning requirements for…
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