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Reticle Device Component

Known as: Reticle 
A grid or pattern in the eyepiece of an optical device designed to establish a scale or position reference.
National Institutes of Health

Related topics

Related topics

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Medical Device Component or Accessory

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Review
2016
Review
2016
Embedded Multi-die Interconnect Bridge (EMIB) -- A High Density, High Bandwidth Packaging Interconnect
The EMIB dense MCP technology is a new packaging paradigm that provides localized high density interconnects between two or more… 
Highly Cited
2016
Highly Cited
2016
EUV progress toward HVM readiness
This past year has witnessed a sharp increase in EUV lithography progress spanning production tools, source and infrastructure to… 
Review
2013
Review
2013
ASML's NXE platform performance and volume introduction
All six NXE:3100, 0.25 NA EUV exposure systems are in use at customer sites enabling device development and cycles of learning… 
Highly Cited
2012
Highly Cited
2012
Food Additives & Contaminants : Part A : Chemistry , Analysis , Control , Exposure & Risk Assessment
Highly Cited
2011
Highly Cited
2011
Pixelated source mask optimization for process robustness in optical lithography.
Optical lithography has enabled the printing of progressively smaller circuit patterns over the years. However, as the feature… 
Highly Cited
2007
Highly Cited
2007
Nonlinear iterative learning control with applications to lithographic machinery
Highly Cited
2006
Highly Cited
2006
Parks and People: Assessing the Human Welfare Effects of Establishing Protected Areas for Biodiversity Conservation
In the last several years, and most particularly since the Vth IUCN World Parks Congress in Durban, South Africa, the… 
Review
2002
Review
2002
Biological basis of visceral pain: recent developments
Highly Cited
2001
Highly Cited
2001
Correction for etch proximity: new models and applications
  • Y. Granik
  • SPIE Advanced Lithography
  • 2001
  • Corpus ID: 63715789
Short-range etch proximity effects increase intra-die CD variability and degrade the IC performance and yield. Tight control of… 
Highly Cited
1973
Highly Cited
1973
Capacitance, area, and thickness variations in thin lipid films.
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