Skip to search formSkip to main contentSkip to account menu

Reflection coefficient

Known as: RC, Reflection coeffecient, Coefficient of reflection 
In physics and electrical engineering the reflection coefficient is a parameter that describes how much of an electromagnetic wave is reflected by an… 
Wikipedia (opens in a new tab)

Related topics

Related topics

24 relations
Analogue filterDeconvolutionElectrical engineeringElectronic circuit

Broader (1)

Electronic engineering

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2006
Highly Cited
2006
Compact Bragg gratings for long-range surface plasmon polaritons
By introducing periodic thickness modulation of thin metal stripes embedded in a dielectric, compact and efficient Bragg gratings… 
Highly Cited
2005
Highly Cited
2005
Soft x-ray resonant reflectivity of low-Z material thin films
Soft x-ray resonant reflectivity, a method for low-Z materials that combines aspects of neutron reflectivity and x-ray… 
Highly Cited
2004
Highly Cited
2004
Carbon nanotube transistor operation at 2.6 Ghz
We present the first demonstration of single-walled carbon nanotube transistor operation at microwave frequencies. To measure the… 
Highly Cited
2004
Highly Cited
2004
A generalized time domain multipath channel and its application in ultra-wideband (UWB) wireless optimal receiver design-Part II: physics-based system analysis
This paper has established a new theoretical framework that allows us to analyze the ultra-wideband system performance using the… 
Highly Cited
2004
Highly Cited
2004
8reatment Technologies for Chromium(VI)
Highly Cited
1995
Highly Cited
1995
Assessment of microwave permittivity for sensing peach maturity
Permittivity measurements were taken from 0.2 to 20 GHz on fresh peaches of three varieties at three stages of maturity during… 
Highly Cited
1990
Highly Cited
1990
A 2 kbit array of symmetric self-electrooptic effect devices
A 64*32 array of symmetric self-electrooptic effect devices, each of which can be operated as a memory element or logic gate, is… 
Highly Cited
1989
Highly Cited
1989
Reflectivity and seismic properties of the deep continental crust
The recovery of drill core from a section of upper amphibolite facies terrane located in the Inner Piedmont of South Carolina… 
Highly Cited
1987
Highly Cited
1987
Two and one‐half dimensional Born inversion with an arbitrary reference
Multidimensional inversion algorithms are presented for both prestack and poststack data gathered on a single line. These… 
Highly Cited
1983
Highly Cited
1983
Measurement of the modal reflectivity of an antireflection coating on a superluminescent diode
A method for measuring the modal reflectivity of the antireflection coating applied to a laser diode is described and… 
By clicking accept or continuing to use the site, you agree to the terms outlined in our Privacy Policy (opens in a new tab), Terms of Service (opens in a new tab), and Dataset License (opens in a new tab)