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Open Verification Library

Known as: OVL 
Open Verification Library (OVL) is a library of property checkers for digital circuit descriptions written in popular Hardware Description Languages… 
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Papers overview

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2015
2015
The increased voltage profile due to excess of reactive power in low load operation mode in power grid is observed. Because of HV… 
2014
2014
Abstract. One of the main issues with accuracy is the bias between the overlay (OVL) target and actual device OVL. In this study… 
2013
2013
The semiconductor industry is moving toward 20nm nodes and below. As the Overlay (OVL) budget is getting tighter at these… 
2013
2013
One of the main challenges related to the growing number of Litho layers and most specifically to Multi Patterning, is the… 
2013
2013
In this paper, we propose a new RFID tag monitoring approach, based on adding an infrastructure circuit to simultaneously monitor… 
2009
2009
Double Patterning Technology (DPT) is now considered as the mainstream technology for 32 nm node lithography. The main DPT… 
2009
2009
  • K. KeilP. Jaschinsky J. Kretz
  • 2009
  • Corpus ID: 115107704
Because of mask cost reduction, electron beam direct write (EBDW) is implemented for special applications such as rapid… 
2006
2006
El tratamiento de la epífora secundaria a obstrucción adquirida de la vía lagrimal (OAVL) en pacientes adultos se basa… 
2003
2003
Developing the advantages of simulation and formal verification on CDFG structure, classified properties verification, a new…