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Open Verification Library
Known as:
OVL
Open Verification Library (OVL) is a library of property checkers for digital circuit descriptions written in popular Hardware Description Languages…
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Related topics
Related topics
7 relations
FIFO (computing and electronics)
Hardware description language
Property Specification Language
SystemC
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
Improvement the reliability of HV — Power transmission lines protection by means of modern devices and methods
A. Gashimov
,
F. L. Khidirov
,
A. Babayeva
,
A. Nayır
Modern Electric Power Systems
2015
Corpus ID: 43434264
The increased voltage profile due to excess of reactive power in low load operation mode in power grid is observed. Because of HV…
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2015
2015
Archeologisch onderzoek op het Pieter Bladelinplein te Middelburg (OVL)
W. D. Clercq
,
Maxime Poulain
,
J. D. Reu
,
Davy Herremans
2015
Corpus ID: 194205082
2014
2014
Device-correlated metrology for overlay measurements
Charlie Chen
,
George K. C. Huang
,
+18 authors
Amei Su
2014
Corpus ID: 122585720
Abstract. One of the main issues with accuracy is the bias between the overlay (OVL) target and actual device OVL. In this study…
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2013
2013
Quality metric for accurate overlay control in <20nm nodes
Dana Klein
,
Eran Amit
,
+7 authors
H. Kurita
Advanced Lithography
2013
Corpus ID: 121971452
The semiconductor industry is moving toward 20nm nodes and below. As the Overlay (OVL) budget is getting tighter at these…
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2013
2013
Multi layer overlay measurement recent developments
Nuriel Amir
,
N. Shuall
,
Inna Tarshish-Shapir
,
P. Leray
Advanced Lithography
2013
Corpus ID: 122207228
One of the main challenges related to the growing number of Litho layers and most specifically to Multi Patterning, is the…
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2013
2013
Assertion based on-line fault detection applied on UHF RFID tag
I. Mezzah
,
O. Kermia
,
H. Chemali
,
Omar Abdelmalek
,
V. Beroulle
,
D. Hély
8th IEEE Design and Test Symposium
2013
Corpus ID: 11578292
In this paper, we propose a new RFID tag monitoring approach, based on adding an infrastructure circuit to simultaneously monitor…
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2009
2009
Mask contribution on CD and OVL errors budgets for double patterning lithography
I. Servin
,
C. Lapeyre
,
+5 authors
M. Mccallum
European Mask and Lithography Conference
2009
Corpus ID: 109589576
Double Patterning Technology (DPT) is now considered as the mainstream technology for 32 nm node lithography. The main DPT…
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2009
2009
Design verification for sub-70-nm DRAM nodes via metal fix using E-beam direct write
K. Keil
,
P. Jaschinsky
,
+6 authors
J. Kretz
European Mask and Lithography Conference
2009
Corpus ID: 115107704
Because of mask cost reduction, electron beam direct write (EBDW) is implemented for special applications such as rapid…
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2006
2006
Dacriointubación cerrada y tubo de silicona como tratamiento de la obstrucción adquirida de vía lagrimal alta en adultos
Alberto F Ansart–Berges
,
Sandra V Sánchez–Navarro
,
J. L. T. Canales
2006
Corpus ID: 74339139
El tratamiento de la epífora secundaria a obstrucción adquirida de la vía lagrimal (OAVL) en pacientes adultos se basa…
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2003
2003
Property-classified hybrid verification based on CDFG
Ming Zhu Ming Zhu
,
Jinian Bian Jinian Bian
,
Weimin Wu Weimin Wu
,
Hongxi Xue Hongxi Xue
ASIC, . Proceedings. 5th International Conference…
2003
Corpus ID: 57950084
Developing the advantages of simulation and formal verification on CDFG structure, classified properties verification, a new…
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