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Noise-domain reflectometry

Noise-domain reflectometry is a type of reflectometry where the reflectometer exploits existing data signals on wiring and does not have to generate… 
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Broader (1)

Electronic engineering
Noise (signal processing)Spread-spectrum time-domain reflectometryTime-domain reflectometry

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2018
2018
A novel perturbed particle swarm optimization-based support vector machine for fault diagnosis in power distribution systems
In this paper, a novel perturbed particle swarm optimization (PPSO) algorithm is investigated to improve the performance of a… 
2016
2016
3D through silicon via profile metrology based on spectroscopic reflectometry for SOI applications
Through-silicon via (TSV) technology is a key feature for 3D circuit integration. TSVs are formed by etching a vertical via and… 
2016
2016
UWB Slot Antenna with Band-Notched Property with Time Domain Modeling based on Genetic Algorithm Optimization
─ This paper presents a kind of band-notched slot antenna with time domain designing method for ultra-wideband (UWB) applications… 
2009
2009
Filterbank Multicarrier Reflectometry for Cognitive Live Wire Testing
Multicarrier reflectometry (MCR) for locating faults on live wires has recently been proposed. This paper studies the use of… 
2009
2009
Effects of Gully Topography on Space-Time Patterns of Soil Moisture in a Semiarid Grassland
Gullies are pervasive topographic features in semiarid grasslands in North America. At the Army's Pinon Canyon Maneuver Site… 
Highly Cited
2005
Highly Cited
2005
Noise-domain reflectometry for locating wiring faults
  • Chet LoC. Furse
  • IEEE transactions on electromagnetic…
  • 2005
  • Corpus ID: 10421959
Reflectometry is commonly used to determine the integrity of cables and wiring. This work describes a new family of… 
2004
2004
Characterizing SiOxNy ARC materials with laser ellipsometry and DUV reflectometry
SiOXNYARCs are critical for maintaining CD control in current and future generations of designs. However, even minor fluctuations… 
Highly Cited
2002
Highly Cited
2002
Iron oxides as a cause of GPR reflections
Iron oxides frequently occur as secondary precipitates in both modern and ancient sediments and may form bands or irregular… 
1996
1996
Combined spectroscopic ellipsometry and reflectometry for advanced semiconductor fabrication metrology
Spectroscopic reflectometry has been a mainstay of optical semiconductor metrology for many years, as has single wavelength… 
1995
1995
Calibration-free measurement of the oxygen saturation in human retinal vessels
The detection of alterations in the microcirculation requires both the measurement of the blood-flow and the measurement of the… 
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