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N-4-(4-fluorophenylaminosulfonyl)benzoisoselenothiazolidone

Known as: N-FPhNS-BIST 
National Institutes of Health

Related topics

Related topics

3 relations

Broader (3)

Lipoxygenase InhibitorsOrganoselenium CompoundsSulfonamides

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
A 2–15-GHz Accurate Built-in-Self-Test System for Wideband Phased Arrays Using Self-Correcting Eight-State $I/Q$ Mixers
A built-in-self-test (BIST) system for wideband phase arrays channels is presented. The BIST is implemented using an on-chip in… 
2016
2016
BIST ULAŞTIRMA ENDEKSİNE KAYITLI ŞİRKETLERİN FİNANSAL PERFORMANSLARININ TOPSİS YÖNTEMİ İLE DEĞERLENDİRİLMESİ
Bu calismanin amaci, Borsa Istanbul ulastirma endeksine kayitli 2 havayolu tasimaciligi sirketinin 6 yillik (2010-2015) finansal… 
2014
2014
Natural (baseline) groundwater quality in the Bist-Doab catchment, Punjab, India: a pilot study comparing shallow and deep aquifers
Groundwater is a critical natural resource across the Indo-Gangetic Basin, sustaining agricultural productivity, industry and… 
2014
2014
FİNANSAL PERFORMANS İLE KURUMSAL YÖNETİM NOTLARI ARASINDAKİ İLİŞKİ: BIST ÜZERİNE BİR UYGULAMA
Arastirma, 2009-2011 doneminde Borsa Istanbul (BIST)’da faaliyet gosteren 18 sirket ve bu sirketlere ait mali tablolardan elde… 
Highly Cited
2013
Highly Cited
2013
Artificial Groundwater Recharge Zones Mapping Using Remote Sensing and GIS: A Case Study in Indian Punjab
Artificial groundwater recharge plays a vital role in sustainable management of groundwater resources. The present study was… 
2013
2013
LARGE SHAREHOLDERS AND FIRM PERFORMANCE: EVIDENCE FROM TURKEY
Using data for the period 2003-2010 of 164 industrial firms listed on Istanbul Stock Exchange (BIST-Borsa Istanbul), we… 
2009
2009
A BIST TPG for Low Power Dissipation and High Fault Coverage
This paper presents a low hardware overhead test pattern generator (TPG) for scan-based built-in self-test (BIST) that can reduce… 
2006
2006
A Novel BIST TPG for Testing of VLSI Circuits
Design for low power testing is primary concern in modern VLSI circuits. In this paper a novel test pattern generator (TPG) is… 
2005
2005
Low-power test pattern generator design for BIST via non-uniform cellular automata
  • H. KiliçL. Oktem
  • IEEE VLSI-TSA International Symposium on VLSI…
  • 2005
  • Corpus ID: 16211979
An efficient low-power test pattern generator (TPG) design for built-in self-test (BIST) is introduced. The approach uses the non… 
1985
1985
Built-In Self-Test Trends in Motorola Microprocessors
The first built-in self-test feature in a Motorola sidered a ¿wart¿ until a RAM test application recast it as a ¿ feature… 
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