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Keysight VEE
Known as:
Agilent VEE
, HP VEE
Keysight VEE is a graphical dataflow programming software development environment from Keysight Technologies for automated test, measurement, data…
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Related topics
Related topics
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Commercial software
Dataflow programming
LabVIEW
MATLAB
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2012
2012
Sensor response time evaluations of trace hydrogen gaseous species with platinum using Kelvin Probe
G. Eranna
,
R. Paris
,
T. Doll
Italian National Conference on Sensors
2012
Corpus ID: 35570335
Kelvin Probe (KP), a non-contact, non-destructive vibrating capacitor device, was used to measure the work function (WF…
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2010
2010
On-wafer mm-wave V-band semi-automatic power measurement system
Hsu-Feng Hsiao
,
Shuw-Guann Lin
,
H. Chiou
,
D. Chang
,
Y. Juang
Asia-Pacific Microwave Conference
2010
Corpus ID: 22784028
This paper proposes an on-wafer mm-wave V-band semi-automatic power measurement system (OMVSPMS) with some external passive…
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2010
2010
Development of a Computer-Aided Teaching and Learning Tool for Digital Filters Using Agilent VEE PRO 6.0
H. Ibrahim
2010
Corpus ID: 61090308
Digital filters play very important roles in digital signal processing (DSP). There are many types of digital filters. The…
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2006
2006
Educational Virtual Instrumentation Application for System Identification
M. Popa
,
R. Ionel
,
V. Groza
,
M. Marcu
IEEE Instrumentation and Measurement Technology…
2006
Corpus ID: 2153490
The PC based virtual instrumentation is a dynamic and attractive alternative to the classic instrumentation. Its main advantages…
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2005
2005
O "V" Epistemológico como Instrumento Metodológico para o Processo de Investigação: Exemplos na Área de Informática na Educação
L. Ferracioli
2005
Corpus ID: 174207540
Abstract. This paper presents the guidelines for the workshop about the design of the process of investigation based on the…
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2002
2002
A Computer Software Platform on Instrument and Measurement & Control System──HP VEE
Li Wei-dong
2002
Corpus ID: 114283953
The characteristics and the programming means of HP VEE are introduced, which is a computer software platform on instrument and…
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2001
2001
A Novel Method for Characterizing RF Automated Tuners
M. Spirito
,
P. Valk
,
R. Mahmoudi
,
M. deKok
,
J. Tauritz
58th ARFTG Conference Digest
2001
Corpus ID: 8811148
A two-step method that avoids cumbersome and lengthy search procedures is described for efficiently calibrating automated load…
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2001
2001
Automatization of the complex dielectric constant measurement
A. Atanasković
,
V. Tasic
,
S. Ivkovic
5th International Conference on…
2001
Corpus ID: 61117264
In this paper are presented two methods for measurement of complex dielectric constant using the microwave cylindrical cavity…
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1999
1999
Reusable test executive and test programs methodology and implementation comparison between HP VEE and LabView
M. Klinger
IEEE Autotestcon Proceedings
1999
Corpus ID: 60999160
The paper outlines the requirements for a reusable test executive and reusable test programs. The concepts of generic test…
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1999
1999
Work Function Study of Iridium Oxide and Molybdenum Using UPS and Simultaneous Fowler-Nordheim I-V Plots with Field Emission Energy Distributions
J. M. Bernhard
1999
Corpus ID: 135671703
The characterization of work functions and field emission stability for molybdenum and iridium oxide coatings was examined…
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