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Internet Listing Display
Known as:
ILD
Internet Listing Display (ILD) was a set of rules put forth by the National Association of Realtors in 2005 to regulate how homes and properties can…
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Papers overview
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Review
2013
Review
2013
DISCOVERY OF A DYNAMICAL COLD POINT IN THE HEART OF THE SAGITTARIUS dSph GALAXY WITH OBSERVATIONS FROM THE APOGEE PROJECT
S. Majewski
,
S. Hasselquist
,
+30 authors
G. Zasowski
2013
Corpus ID: 119307084
The dynamics of the core of the Sagittarius (Sgr) dwarf spheroidal (dSph) galaxy are explored using high-resolution (R ∼ 22, 500…
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2012
2012
The CLIC ILD CDR Geometry for the CDR Monte Carlo Mass Production
A. Muennich
,
A. Sailer
2012
Corpus ID: 61444147
The CLIC ILD CDR detector for the Monte Carlo event simulation is described in a GEANT4 application, with some parameters…
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2010
2010
Challenges of Cu wire bonding on low-k/Cu wafers with BOA structures
C. Lee
,
L. Higgins
Electronic Components and Technology Conference
2010
Corpus ID: 25829770
This study describes the development of a Cu wire bond assembly solution for ICs using low dielectric constant (low K…
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Highly Cited
2009
Highly Cited
2009
Through-Silicon Via (TSV)-induced noise characterization and noise mitigation using coaxial TSVs
Nauman H. Khan
,
S. Alam
,
S. Hassoun
IEEE International Conference on 3D System…
2009
Corpus ID: 14386622
Through-Silicon Via (TSV) is a critical interconnect element in 3D integration technology. TSVs introduce many new design…
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2008
2008
Preparation, microstructure, and property characterizations of fluorinated polyimide-organosilicate hybrids
T. Chiang
,
Szu-Ling Liu
,
Shyh-Yang Lee
,
T. Hsieh
2008
Corpus ID: 56099392
2006
2006
Sea-of-leads MEMS I/O interconnects for low-k IC packaging
B. Dang
,
M. Bakir
,
C. Patel
,
H. Thacker
,
J. Meindl
Journal of microelectromechanical systems
2006
Corpus ID: 22559401
Technology feasibility of MEMS-type chip I/O interconnects (namely Sea-of-Leads or SoL) is demonstrated. Acting like a spring, a…
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Highly Cited
2003
Highly Cited
2003
Fundamental Tribological and Removal Rate Studies of Inter-Layer Dielectric Chemical Mechanical Planarization
A. Philipossian
,
S. Olsen
2003
Corpus ID: 33414697
In this work, real-time coefficient of friction (COF) analysis, in conjunction with a new method for approximating the Sommerfeld…
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2003
2003
Process roadmap and challenges for metal barriers [copper interconnects]
P. Moon
,
V. Dubin
,
S. Johnston
,
J. Leu
,
K. Raol
,
C. Wu
IEEE International Electron Devices Meeting
2003
Corpus ID: 34021490
Copper interconnects require two types of barrier layers: a liner on the sides and bottoms of the damascene features and a cap on…
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1997
1997
An improved NbN integrated circuit process featuring thick NbN ground plane and lower parasitic circuit inductances
G. Kerber
,
L. Abelson
,
R. Elmadjian
,
G. Hanaya
,
E. Ladizinsky
IEEE transactions on applied superconductivity
1997
Corpus ID: 23775777
We report on the development of a 10 K, NbN superconductive integrated circuit (IC) technology that utilizes an improved SiO/sub…
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1996
1996
The MOS inversion layer as a minority carrier injector
F. Udrea
,
G. Amaratunga
,
J. Humphrey
,
J. Clark
,
A. Evans
IEEE Electron Device Letters
1996
Corpus ID: 649051
In this paper we report the first experimental demonstration of the concept of MOS inversion layer injection (ILI). The new…
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