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Integral nonlinearity
Known as:
Integral non-linearity
Integral nonlinearity (acronym INL) is the maximum deviation between the ideal output of a DAC and the actual output level (after offset and gain…
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Related topics
Related topics
4 relations
Analog-to-digital converter
Differential nonlinearity
Digital-to-analog converter
Broader (1)
Digital signal processing
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2013
2013
The swapping binary-window DAC switching technique for SAR ADCs
Yung-Hui Chung
International Symposium on Circuits and Systems
2013
Corpus ID: 21272830
The binary-window capacitor switching algorithm is proposed for a binary-weighted capacitor array successive approximation…
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2011
2011
A 28GS/s 6b pseudo segmented current steering DAC in 90nm CMOS
T. Alpert
,
F. Lang
,
D. Ferenci
,
M. Grozing
,
M. Berroth
IEEE MTT-S International Microwave Symposium
2011
Corpus ID: 19354576
A pseudo segmented twofold time-interleaved 6-bit digital-to-analog converter (DAC) occupies 0.28 mm2 chip area in a standard 90…
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Highly Cited
2010
Highly Cited
2010
A 5-bit 3.2-GS/s Flash ADC With a Digital Offset Calibration Scheme
Ying-Zu Lin
,
Cheng-Wu Lin
,
Soon-Jyh Chang
IEEE Transactions on Very Large Scale Integration…
2010
Corpus ID: 10703385
In high-speed Flash analog-to-digital converters (ADCs), preamplifiers are often placed in front of a comparator to reduce…
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Highly Cited
2009
Highly Cited
2009
A parallel 32×32 time-to-digital converter array fabricated in a 130 nm imaging CMOS technology
M. Gersbach
,
Y. Maruyama
,
+7 authors
E. Charbon
Proceedings of ESSCIRC
2009
Corpus ID: 4638032
We report on the design and characterization of a 32 × 32 time-to-digital converter (TDC) array implemented in a 130 nm imaging…
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2009
2009
Capacitive-Sensor Interface With High Accuracy and Stability
R. Nojdelov
,
S. Nihtianov
IEEE Transactions on Instrumentation and…
2009
Corpus ID: 23175719
This paper presents a capacitive-sensor interface with high accuracy and excellent stability. The range of the measured…
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2008
2008
Built-in Self-Calibration of On-chip DAC and ADC
Wei Jiang
,
V. Agrawal
IEEE International Test Conference
2008
Corpus ID: 2143836
Linearity measurements are significant for assessing the performance of a modern mixed-signal system-on-chip. In this paper a new…
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2008
2008
Linearity Testing of A/D Converters Using Selective Code Measurement
Shalabh Goyal
,
A. Chatterjee
Journal of electronic testing
2008
Corpus ID: 14352014
Measurement of integral non-linearity (INL) and differential non-linearity (DNL) of an A/D converter using the histogram method…
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2007
2007
A spectral approach to estimate the INL of A/D converter
J. Janik
,
Vincent Fresnaud
Comput. Stand. Interfaces
2007
Corpus ID: 21819391
2003
2003
Minimizing the peak-to-average power ratio of OFDM signals via convex optimization
A. Aggarwal
,
T. Meng
GLOBECOM '03. IEEE Global Telecommunications…
2003
Corpus ID: 58922
Efficient OFDM transmission has been limited by power amplifier (PA) non-linearity combined with OFDM's high peak-to-average…
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Review
1999
Review
1999
Linearity testing issues of analog to digital converters
T. Kuyel
International Test Conference . Proceedings (IEEE…
1999
Corpus ID: 206679047
This paper is a detailed overview of the practical issues related to linearity testing of analog to digital converters. The focus…
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