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Functional testing
Known as:
Functional test
Functional testing is a quality assurance (QA) process and a type of black-box testing that bases its test cases on the specifications of the…
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API testing
Acceptance testing
Application Center Test
Black-box testing
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2011
2011
Silver vanadate nanoribbons: A label-free bioindicator in the conversion between human serum transferrin and apotransferrin via surface-enhanced Raman scattering
Qing Zhou
,
Mingwang Shao
,
+4 authors
Shuitong Lee
2011
Corpus ID: 95992580
Silver vanadate nanoribbons were synthesized via a hydrothermal process, which exhibited surface-enhanced Raman scattering effect…
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2008
2008
Power-Aware At-Speed Scan Test Methodology for Circuits with Synchronous Clocks
B. Nadeau-Dostie
,
K. Takeshita
,
J. Cote
IEEE International Test Conference
2008
Corpus ID: 24801611
The BurstModetrade test clocking methodology, first presented in, is improved to handle circuits with synchronous clocks of…
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2006
2006
Validación de la prueba Young Adult Alcohol Problems Screening Test, YAAPST, en un grupo de estudiantes universitarios de la Pontificia Universidad Javeriana de Bogotá
María González
,
Mónica María Palma Riveros
,
J. I. Uribe
,
Socorro Moreno Luna
2006
Corpus ID: 142869242
Dada la prevalencia del consumo de alcohol en Colombia y su incidencia en jovenes, este estudio busco validar la escala YAAPST…
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2004
2004
A NEW TEST STRATEGY FOR COMPLEX PRINTED CIRCUIT BOARD ASSEMBLIES
S. Oresjo
2004
Corpus ID: 7961971
The trend in Printed Circuit Board Assembly (PCBA) technology is towards higher complexity. Many boards have significantly more…
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2003
2003
Analysis of IC Manufacturing Process Deformations: An automated approach using SRAM bit fail maps
T. Zanon
,
M. Ferdman
,
K. Komeyli
,
Wojciech Maly
2003
Corpus ID: 16306634
SRAM bit fail maps (BFM) are routinely collected during earlier phases of yield ramping, providing a rich source of information…
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2002
2002
Adaptability and Interfaces : Key to Efficient Pervasive Computing
A. Zaslavsky
2002
Corpus ID: 18552067
As mobile and embedded computing devices become more pervasive, the nature of interaction between users and computers is evolving…
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1999
1999
On the Integration of Design and Test for Chips Embedding MEMS
S. Mir
,
B. Charlot
IEEE Design & Test of Computers
1999
Corpus ID: 16804158
This article illustrates how fault-based, defect-oriented test approaches can be applied to the problem of testing the next…
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1999
1999
A method for measuring the functional size of embedded software
S. Oligny
,
J. Desharnais
,
A. Abran
1999
Corpus ID: 14083309
Software has become a key component of most automated process control devices. It offers a high degree of flexibility in…
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1988
1988
A Functional Testing Method for Microprocessors
Li Shen
,
S. Su
IEEE Trans. Computers
1988
Corpus ID: 31019926
A method is presented for functional testing of microprocessors. First, a control fault model at the RTL (register transfer…
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1982
1982
Automatic Generation of Microprocessor Test Programs
C. Bellon
,
A. Liothin
,
+4 authors
M. Issenman
Design Automation Conference
1982
Corpus ID: 755242
This paper presents an automatic generation system for behavioral test programs of microprocessors. First, the test environment…
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