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Functional testing

Known as: Functional test 
Functional testing is a quality assurance (QA) process and a type of black-box testing that bases its test cases on the specifications of the… 
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Related topics

Related topics

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API testingAcceptance testingApplication Center TestBlack-box testing

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2010
2010
Experimental assessment of combining pattern matching strategies with VIATRA2
As recent tool contests demonstrated graph transformation tools scale up to handle very large models for model transformations… 
Review
2009
Review
2009
Regression testing with UML software designs: A survey
The unified modeling language (UML) designs come in a variety of different notations. UML designs can be quite large and… 
2008
2008
Development of the ATLAS FE-I4 pixel readout IC for b-layer Upgrade and Super-LHC
Motivated by the upcoming upgrade of the ATLAS hybrid pixel detector, a new Front-End (FE) IC is being developed in a 130nm… 
2008
2008
Power-Aware At-Speed Scan Test Methodology for Circuits with Synchronous Clocks
The BurstModetrade test clocking methodology, first presented in, is improved to handle circuits with synchronous clocks of… 
2006
2006
Validación de la prueba Young Adult Alcohol Problems Screening Test, YAAPST, en un grupo de estudiantes universitarios de la Pontificia Universidad Javeriana de Bogotá
Dada la prevalencia del consumo de alcohol en Colombia y su incidencia en jovenes, este estudio busco validar la escala YAAPST… 
2005
2005
APPLICATION OF TOLERANCE MAPPING IN AEC SYSTEMS
Tolerance maps are a tool for specifying, analyzing and allocating tolerances for both product and process design. This paper… 
2004
2004
The "Umbrella" (or Sanctity of Contract/Pacta sunt Servanda) Clause in Investment Arbitration: A Comment on Original Intentions and Recent Cases
The extent to which customary law (in the past) and modern investment treaties (bilateral/multilateral) at present protect… 
2003
2003
Analysis of IC Manufacturing Process Deformations: An automated approach using SRAM bit fail maps
SRAM bit fail maps (BFM) are routinely collected during earlier phases of yield ramping, providing a rich source of information… 
2002
2002
Suitability of evolutionary algorithms for evolutionary testing
Evolutionary testing is based on the principle of searching for relevant test cases in the input domain of the system under test… 
1997
1997
Improving the testability of mixed-signal integrated circuits
The author presents a discussion on several methods that can be used to improve the testability of mixed-signal integrated… 
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