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Functional testing

Known as: Functional test 
Functional testing is a quality assurance (QA) process and a type of black-box testing that bases its test cases on the specifications of the… 
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Related topics

Related topics

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API testingAcceptance testingApplication Center TestBlack-box testing

Papers overview

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Highly Cited
2017
Highly Cited
2017
Freestanding transparent metallic network based ultrathin, foldable and designable supercapacitors
Fully integrated ultrathin, transparent and foldable energy storage devices are essential for the development of smart wearable… 
2010
2010
Experimental assessment of combining pattern matching strategies with VIATRA2
As recent tool contests demonstrated graph transformation tools scale up to handle very large models for model transformations… 
2010
2010
Automated Test Case Generation Using Classification Trees
[This abstract is based on the authors’ abstract.] The basic problem in software testing is selecting a set of test cases. This… 
2008
2008
Development of the ATLAS FE-I4 pixel readout IC for b-layer Upgrade and Super-LHC
Motivated by the upcoming upgrade of the ATLAS hybrid pixel detector, a new Front-End (FE) IC is being developed in a 130nm… 
2006
2006
Validación de la prueba Young Adult Alcohol Problems Screening Test, YAAPST, en un grupo de estudiantes universitarios de la Pontificia Universidad Javeriana de Bogotá
Dada la prevalencia del consumo de alcohol en Colombia y su incidencia en jovenes, este estudio busco validar la escala YAAPST… 
2005
2005
APPLICATION OF TOLERANCE MAPPING IN AEC SYSTEMS
Tolerance maps are a tool for specifying, analyzing and allocating tolerances for both product and process design. This paper… 
Highly Cited
2003
Highly Cited
2003
Implantable myoelectric sensors (IMES) for upper-extremity prosthesis control- preliminary work
We are developing a multichannel/multifunction prosthetic hand/arm controller system capable of receiving and processing signals… 
2003
2003
Analysis of IC Manufacturing Process Deformations: An automated approach using SRAM bit fail maps
SRAM bit fail maps (BFM) are routinely collected during earlier phases of yield ramping, providing a rich source of information… 
2002
2002
Suitability of evolutionary algorithms for evolutionary testing
Evolutionary testing is based on the principle of searching for relevant test cases in the input domain of the system under test… 
Highly Cited
1997
Highly Cited
1997
Oscillation built-in self test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits
This paper describes a new built-in self test (BIST) technique suitable for both functional and structural testing of analog and… 
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