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Electron beam tomography

Known as: Electron-beam computed tomography, Electron beam imaging, EBT 
Electron beam tomography (EBT) is a specific form of computed tomography (CAT or CT) in which the X-ray tube is not mechanically spun in order to… 
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Related topics

Related topics

2 relations
CT scanCathode ray tube

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2004
Highly Cited
2004
High inversion current in silicon nanowire field effect transistors
Silicon nanowire (SiNW) field effect transistors (FETs) with channel widths down to 20 nm have been fabricated by a conventional… 
Highly Cited
2004
Highly Cited
2004
Silicon nanopillars for mechanical single-electron transport
Nanomechanical systems have been shown to accurately regulate the flow of electric current. We present the concept and… 
Highly Cited
2004
Highly Cited
2004
Controlled Growth of Y-Junction Nanotubes Using Ti-Doped Vapor Catalyst
We demonstrate a bulk process for the synthesis of Y-junction carbon nanotubes using Ti-doped Fe catalysts. It is shown that the… 
Review
2003
Review
2003
Nanostructured Al–Fe alloys produced by e-beam deposition: static and dynamic tensile properties
Highly Cited
2000
Highly Cited
2000
Sub-10 nm linewidth and overlay performance achieved with a fine-tuned EBPG-5000 TFE electron beam lithography system
For advanced nanoelectronic device concepts bridging the extended CMOS-world with the ultimate solution of single electron… 
1997
1997
Fabrication and characterization of room temperature silicon single electron memory
A single electron memory was demonstrated in crystalline silicon that has a transistor channel width of ∼10 nm and a nanoscale… 
1989
1989
Boron neutralization and hydrogen diffusion in silicon subjected to low-energy hydrogen implantation
Using the hydrogen neutralization of the boron acceptor, the diffusion of hydrogen is investigated in the temperature range 20… 
1980
1980
Ray Tracing near the Electron Cyclotron Frequency with Application to EBT
The general problem of ray tracing in the electron cyclotron range of frequencies is addressed with the view of applying… 
Highly Cited
1979
Highly Cited
1979
Recent advances in electron-beam lithography for the high-volume production of VLSI devices
Recent advances in scanning-electron-beam lithography techniques have increased the efficiency of serial exposure by several… 
Highly Cited
1978
Highly Cited
1978
EBT: A Comprehensive Test Generation Technique for Highly Sequential Circuits
A new test generation technique for highly sequential circuits, utilizing functional models, with ability to produce tests for… 
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