Skip to search formSkip to main contentSkip to account menu

Digital Linear Tape

Known as: DLTtape, Super Digital Linear Tape, DLT 
Digital Linear Tape (DLT; previously called CompacTape) is a magnetic tape data storage technology developed by Digital Equipment Corporation (DEC… 
Wikipedia (opens in a new tab)

Related topics

Related topics

19 relations
Advanced Intelligent TapeData compressionData remanenceDegaussing

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
Defect Characterization of 4H-SIC by Deep Level Transient Spectroscopy (DLTS) and Influence of Defects on Device Performance
Review
2010
Review
2010
Investigation of P-I-N GAAS Structures by Dlts Method
The main goal of the work is the interpretation of DLTS (Deep Level Transient Spectroscopy) spectra measurements on commercial… 
2007
2007
DLTS study of deep level defects in Li-ion irradiated bipolar junction transistor
2004
2004
Misfit Dislocations Study in MOVPE Grown Lattice-Mismatched InGaAs/GaAs Heterostructures by Means of DLTS Technique
Two deep traps associated with lattice-mismatch induced defects in n-type In0.042Ga0.958As/GaAs heterostructures and three deep… 
2004
2004
Use of extrusion-spheronization to develop: Controlled-release dosage forms for diltiazem hydrochloride
The authors explore the possibility of using extrusion-spheronization to develop a matrix-based, controlled-release formulation… 
2003
2003
Media stability and life expectancies of magnetic tape for use with IBM 3590 and digital linear tape systems
The purpose of this study was to determine the environmental stability and life expectancies of magnetic media used with certain… 
2002
2002
DFT-based spectral moments estimators for spaceborne Doppler precipitation radars
In this paper an in-depth analysis on the performance of the Fourier analysis in estimating the first moment of Doppler spectra… 
2001
2001
Evaluating focused factory benefits with queuing theory
Review
1989
Review
1989
Deep Levels In InP By DLTS and TSCAP: Survey And Recent Data
Electron and hole traps in the same p-InP:Zn substrate were studied by DLTS and TSCAP methods prior to and after irradiation… 
1980
1980
Photo-Excited DLTS: Measurement of Minority Carrier Traps
Novel methods which take into account the temperature dependence of the amplitude of capacitance transient are presented to… 
By clicking accept or continuing to use the site, you agree to the terms outlined in our Privacy Policy (opens in a new tab), Terms of Service (opens in a new tab), and Dataset License (opens in a new tab)