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Defect criticality
Known as:
%22defect criticality%22
In the context of software quality, defect criticality is a measure of the impact of a software defect. It is defined as the product of severity…
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
Review
2008
Review
2008
Defect criticality index (DCI): a new methodology to significantly improve DOI sampling rate in a 45nm production environment
Yoshiyuki Sato
,
Yasuyuki Yamada
,
+5 authors
E. Chang
SPIE Advanced Lithography
2008
Corpus ID: 122526075
Increasing inspection sensitivity may be necessary for capturing the smaller defects of interest (DOI) dictated by reduced…
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Review
2007
Review
2007
A novel run-time MEEF-driven defect disposition extending high resolution contamination inspection to next generation photomask
William Chou
,
Y. Cheng
,
+9 authors
Aditya Dayal
Photomask Japan
2007
Corpus ID: 109478011
The advent of device miniaturization necessitates sub-half-micron features delineated on reticles where photomask quality, more…
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Review
2007
Review
2007
Automatic optimization of MEEF-driven defect disposition for contamination inspection challenges
T. Huang
,
Aditya Dayal
,
+6 authors
Peter Peng
SPIE Photomask Technology
2007
Corpus ID: 111177181
Ever-tightened design rules and ensuing aggressive OPC features pose significant challenges for wafer fabs in the pursuit of…
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2007
2007
Using design based binning to improve defect excursion control for 45nm production
Crockett Huang
,
C. Young
,
+4 authors
E. Chang
International Symposium on Semiconductor…
2007
Corpus ID: 36179856
For advanced device (45 nm and below), we proposed a novel method to monitor systematic and random excursion. By integrating…
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2006
2006
The Assessment of Aspects Related to Defect Criticality in CFRP Strengthened Concrete Flexural Members
Jason C Delaney
,
V. Karbhari
2006
Corpus ID: 137669383
This report describes a study which involved laboratory testing of 62 large scale flexural concrete members that were…
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2005
2005
Assessment and criticality of defects and damage in materials systems.
M. Gower
,
G. Sims
,
R. Lee
,
S. Frost
,
M. Stone
,
M. Wall
2005
Corpus ID: 181357520
A defect criticality framework and assessment procedure for composite material systems has been proposed, based on the multi…
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Review
2003
Review
2003
Enhanced dispositioning of reticle defects for advanced masks using virtual stepper with automated defect severity scoring
L. Pang
,
Alex Lu
,
Jessie Y.C. Chen
,
Eric Guo
,
L. Cai
,
Jiunn-Hung Chen
SPIE Photomask Technology
2003
Corpus ID: 108438144
As the semiconductor industry continues to scale down critical dimensions (CD), proximity effects get more and more severe. As…
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2003
2003
Material Data Requirements and Recommended Test Methods for the Predictive Modelling of Defect Criticality in Composite Material Systems
M. Gower
,
G. Sims
2003
Corpus ID: 138163673
Prior work within the MMS13 project had proposed an approach for the modelling of delamination and matrix micro-cracking defect…
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2001
2001
Quality and Monitoring of Structural Rehabilitation Measures. Part 1: Description of Potential Defects
H. Kaiser
,
V. Karbhari
2001
Corpus ID: 55498795
This report is the first of a series of reports discussing the typical appearance, identification, characterization and effect of…
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1978
1978
Proceedings of Four Symposia on Nondestructive Testing of Tires
P. E. Vogel
1978
Corpus ID: 110701577
Abstract : This four-volume hard-cover set of Symposium Proceedings devoted to Nondestructive Testing of Tires contains the…
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