Skip to search formSkip to main contentSkip to account menu

Data degradation

Known as: Data decay, Data rot 
Data degradation, also known as data decay or data rot, is a colloquial computing phrase for the gradual decay of storage media. It should not be… 
Wikipedia (opens in a new tab)

Related topics

Related topics

26 relations
BackupChecksumData curationData scrubbing

Broader (1)

Data quality

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2005
2005
Estimation of low-dose-rate degradation on bipolar linear integrated circuits using switching experiments
The low-dose-rate response of five bipolar integrated circuits is evaluated on the basis of switching experiments. Such… 
2005
2005
Selective enrichment of a pyrene degrader population and enhanced pyrene degradation in Bermuda grass rhizosphere
Rhizosphere soil has a more diverse and active microbial community compared to nonvegetated soil. Consequently, the rhizosphere… 
2002
2002
Liquid crystal dynamics in the isotropic phase
The dynamics in the isotropic phase of the liquid crystal 1-isothiocyanato-(4-propylcyclohexyl) benzene (3-CHBT) are investigated… 
Highly Cited
2001
Highly Cited
2001
Spatial heterogeneity in the metabolism and dynamics of isoproturon degrading microbial communities in soil
Abstract. The characteristics of isoproturon [3-(4-isopropylphenyl)-1,1-dimethylurea] metabolism were investigated in soil taken… 
2000
2000
Photocatalytic degradation of salicylic acid on fixed TiO2 - kinetic studies
The photocatalytic activity of TiO2 deposits (Degussa-P25 and Sachtleben-Hombikat) has been studied using salicylic acid as a… 
Highly Cited
1998
Highly Cited
1998
Structural disorder induced in hydrogenated amorphous silicon by light soaking
We show, using variable coherence transmission electron microscopy, that light soaking of amorphous hydrogenated silicon thin… 
Highly Cited
1988
Highly Cited
1988
Selection of white-rot fungi for biopulping☆
1984
1984
Epoxy Degradation Induced Au-Al Intermetallic Void Formation in Plastic Encapsulated MOS Memories
Previous high temperature aging studies have shown that the presence of epoxy in integrated circuit packages degrades the… 
Highly Cited
1983
Highly Cited
1983
Comparison of characteristics of n-channel and p-channel MOSFET's for VLSI's
A comparison of device characteristics of n-channel and p-channel MOSFET's is made from the overall viewpoint of VLSI… 
1983
1983
Spreading resistance in submicron MOSFET's
The spreading resistance due to current crowding at the end-points of an FET channel is investigated. An analytic expression is… 
By clicking accept or continuing to use the site, you agree to the terms outlined in our Privacy Policy (opens in a new tab), Terms of Service (opens in a new tab), and Dataset License (opens in a new tab)