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Data degradation

Known as: Data decay, Data rot 
Data degradation, also known as data decay or data rot, is a colloquial computing phrase for the gradual decay of storage media. It should not be… 
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Papers overview

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Highly Cited
2012
Highly Cited
2012
Facile synthesis of mesoporous CdS nanospheres and their application in photocatalytic degradation and adsorption of organic dyes
CdS nanospheres with an average diameter of 40 nm, mesopores of 11.2 nm and a large specific surface area of 89.66 m2 g−1 are… 
Highly Cited
2011
Highly Cited
2011
Taphonomic degradation of molluscan remains during thirteen years on the continental shelf and slope of the northwestern Gulf of Mexico
2005
2005
Estimation of low-dose-rate degradation on bipolar linear integrated circuits using switching experiments
The low-dose-rate response of five bipolar integrated circuits is evaluated on the basis of switching experiments. Such… 
2005
2005
Selective enrichment of a pyrene degrader population and enhanced pyrene degradation in Bermuda grass rhizosphere
Rhizosphere soil has a more diverse and active microbial community compared to nonvegetated soil. Consequently, the rhizosphere… 
2002
2002
Liquid crystal dynamics in the isotropic phase
The dynamics in the isotropic phase of the liquid crystal 1-isothiocyanato-(4-propylcyclohexyl) benzene (3-CHBT) are investigated… 
Highly Cited
2001
Highly Cited
2001
Spatial heterogeneity in the metabolism and dynamics of isoproturon degrading microbial communities in soil
Abstract. The characteristics of isoproturon [3-(4-isopropylphenyl)-1,1-dimethylurea] metabolism were investigated in soil taken… 
1993
1993
Red Books for threatened Mediterranean landscapes as an innovative tool for holistic landscape conservation. Introduction to the western Crete Red Book case study
Highly Cited
1991
Highly Cited
1991
Distortion due to gain tilt of erbium-doped fiber amplifiers
It was found experimentally and theoretically that the second-order intermodulation product, namely composite second-order (CSO… 
1984
1984
Epoxy Degradation Induced Au-Al Intermetallic Void Formation in Plastic Encapsulated MOS Memories
Previous high temperature aging studies have shown that the presence of epoxy in integrated circuit packages degrades the… 
1983
1983
Spreading resistance in submicron MOSFET's
The spreading resistance due to current crowding at the end-points of an FET channel is investigated. An analytic expression is… 
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