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Critical process parameters
Critical process parameters (CPP) in pharmaceutical manufacturing are key variables affecting the production process. CPPs are attributes that are…
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Related topics
Related topics
3 relations
Broader (3)
Business process
Enterprise modelling
Formal methods
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2018
2018
Points to Consider in Manufacturing Operations
G. Hodge
2018
Corpus ID: 115673283
2018
2018
Advanced control for the continuous dropwise additive manufacturing of pharmaceutical products
Elçin Içten
,
G. Reklaitis
,
Z. Nagy
2018
Corpus ID: 139118118
2018
2018
QUALITY BY DESIGN- A NEW APPROACH TO DRUG DEVELOPMENT
R. Dey
,
D. R. Chowdhury
2018
Corpus ID: 55744696
Quality by Design (QbD) is a modern, scientific approach that formalizes product design, automates manual testing, and…
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2016
2016
The Process Validation Protocol—PPQ
S. Ostrove
2016
Corpus ID: 59085112
2014
2014
Quality by Design: A Paradigm for Industry
Swapnil Nivrutti Misar
,
M. H. Ansari
,
D. Derle
,
K. Bhalerao
2014
Corpus ID: 54660988
Quality by Design (QbD) refers to a holistic approach towards drug development. The quality in the process and product is neither…
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2013
2013
Preparation of ZnO semiconductor formaldehyde gas sensor
Feng Qiaohua
,
Zhao Ruru
,
Ma Xintian
,
Shi Yunbo
Proceedings of 2nd International Conference on…
2013
Corpus ID: 9836030
Aimed at the current interior decoration formaldehyde pollution problems, through the analysis of the metal oxide semiconductor…
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2007
2007
A look at the statistical identification of critical process parameters in friction stir welding
J. Record
,
J. Covington
,
T. Nelson
,
C. Sorensen
,
B. W. Webb
2007
Corpus ID: 138539518
Many fundamental physical relationships governing the friction stir welding (FSW) process remain largely unexplored. Recent…
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2006
2006
Development of a Fabrication Process for Sol-Gel / Metal Hydride Composite Granules ( U )
J. Congdon
2006
Corpus ID: 32266991
2005
2005
Current thoughts on critical process parameters and API synthesis
William P. Ganzer
,
Joan A. Materna
,
M. Mitchell
,
L. Wall
2005
Corpus ID: 108228422
A stepwise, process riskassessment approach can facilitate the identification and understanding of critical process parameters…
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2000
2000
The Impact of Low Cost High Density Substrates on RF Structure Integration
D. Cottet
,
J. Grzyb
,
G. Tröster
2000
Corpus ID: 17902894
A new low cost thin film substrate technology was developed within the EU research project LAP. The project’s substrate cost…
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