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Concurrent testing

Concurrent testing is a software testing activity that determines the stability of a system or application under test during normal activity… 
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Related topics

Related topics

7 relations
Load testingScalability testingScenario analysisSimulation

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
Engineering a Cyber-Physical Intersection Management - An Experience Report
The engineering of cyber-physical systems (CPS) imposes a huge challenge for today’s software engineering processes. Not only are… 
2007
2007
Instrumenting where it hurts: an automatic concurrent debugging technique
As concurrent and distributive applications are becoming more common and debugging such applications is very difficult, practical… 
2002
2002
Adapting an SoC to ATE concurrent test capabilities
Concurrent test features are available in SoC testers to increase ATE throughput. To exploit these new features, design… 
1995
1995
Concurrent testing of processes
Using a form of “ST-operational semantics” we develop a noninterleaving semantic theory of processes based on testing. This… 
1993
1993
Observing "true" concurrency
In concurrent process theory, processes are often modeled by state machines and Petri Nets. Algebraic process theories based on… 
1993
1993
Generalized Hopfield Neural Network for Concurrent Testing
The use of generalized Hopfield neural networks in designing the checking circuitry of a concurrent testable circuit is discussed… 
1992
1992
Concurrent test scheduling in built-in self-test environment
  • C. ChenJ. Yuen
  • Proceedings IEEE International Conference on…
  • 1992
  • Corpus ID: 195349600
Concurrent testing is used to reduce overall self-testing time and further exploit the power of the built-in self-test (BIST… 
1991
1991
Optimization Problems on Concurrent Testing Solved by Neural Networks
This communication presents an Extended Hopfield Neural Network which has been applied to design the extra circuitry for testing… 
1990
1990
Concurrent testing of VLSI circuits using conservative logic
A concurrent error detection and design for testability technique based on conservative logic is presented. The theoretical… 
Highly Cited
1985
Highly Cited
1985
A Self-Testing Dynamic RAM Chip
A novel approach to making very large dynamic RAM chips self-testing is presented. It is based on two main concepts on-chip… 
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