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Cdm-Mago-Tsu complex

Known as: Cdm-Mago-Tsu complex location 
National Institutes of Health

Papers overview

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2013
2013
GREEN INFRASTRUCTURE IN THE STATE OF NEW JERSEY
2008
2008
Scrubber clean process induced CDM ESD-like: CSM (Charged Surface Model) event caused by dummy patterns
This paper describes a process-induced damage phenomenon on the Poly-Insulator-Poly (PIP) capacitor of mixed-mode circuit during… 
2008
2008
A new multi-path AODV routing based on distance of nodes from the network center
Routing is a very important matter for ad hoc networks which means choosing the suitable and correct path for transferring data… 
2008
2008
The Relevance of Confucian Philosophy to Modern Concepts of Leadership and Followership
The purpose of this paper is to discuss Confucian philosophy and compare its relevance to modern concepts of leadership and… 
2005
2005
Modeling of OFDM-based systems with frequency offsets and frequency selective fading channels
We derive vector transmission models for OFDM-based systems: pure OFDM, multiuser OFDM (OFDMA), CDM-OFDMA and MC-CDMA. Two kinds… 
2003
2003
Characterization and Modeling of Transient Device Behavior under CDM ESD Stress
Device physical effects that strongly influence the transient behavior during very fast, high current pulses are discussed. The… 
2002
2002
Characterizing the primordial cosmic perturbations using map and Planck
The most general homogeneous and isotropic statistical ensemble of linear scalar perturbations regular at early times in a… 
1998
1998
Investigation into socketed CDM (SDM) tester parasitics
The ESD Association standards working group 5.3.2 is analyzing the procedure and stress that is applied to a device under test… 
1997
1997
A large scale double beta and dark matter experiment: On the physics potential of GENIUS
The physics potential of GENIUS, a recently proposed double beta decay and dark matter experiment is discussed. The experiment… 
1995
1995
Latent gate oxide defects caused by CDM-ESD
  • J. Reiner
  • Electrical Overstress/Electrostatic Discharge…
  • 1995
  • Corpus ID: 43675794
This paper investigates the phenomenon of latent gate oxide defects in MOS ICs caused by charge device model ESD (CDM-ESD). It… 
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