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Bathymodiolus sp. Si1-1

 
National Institutes of Health

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2018
2018
Orbital-selective superconductivity in the nematic phase of FeSe
The interplay between electronic orders and superconductivity is central to the physics of unconventional superconductors, and is… Expand
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2012
2012
Structural variations of Si1−xCx and their light absorption controllability
The emergence of third-generation photovoltaics based on Si relies on tunable bandgap materials with embedded nanocrystalline Si… Expand
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2011
2011
Sorption speciation of nickel(II) onto Ca-montmorillonite: batch, EXAFS techniques and modeling.
The sorption speciation of Ni(II) on Ca-montmorillonite was evaluated using a combination of batch experiments, extended X-ray… Expand
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2009
2009
Schottky Barrier Height of Nickel Silicide Contacts Formed on $\hbox{Si}_{1 - x}\hbox{C}_{x}$ Epitaxial Layers
Embedded Si1 - xCx source/drain junctions are currently considered to achieve electron mobility enhancement in nMOSFETs by… Expand
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2008
2008
The effect of nitrogen on the cycling performance in thin-film Si1-xNx anode
Abstract The effects of nitrogen on the electrochemical properties of silicon–nitrogen (Si 1− x N x ) thin films were examined in… Expand
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2008
2008
Structural , electrical and photovoltaic characterization of Si nanocrystals embedded SiC matrix and Si nanocrystals / cSi heterojunction devices
Thin films of Si nanocrystals (Si NCs) embedded in a silicon carbide (SiC) matrix (Si-NC:SiC) were prepared by alternating… Expand
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2007
2007
Hyalotekite , a complex lead borosilicate : its crystal structure and the lone-pair effect of Pb ( II )
Hyalotekite, ca.Pb2Ba2Ca2[B2(Sir 172Be172)Si6O2a]F,Z: 2, a = l l.310(2), b : 10.955(2), c = 10.317(3) 4,, :90.43(2)", B:90.02(2… Expand
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2004
2004
Electrical characterization of photo-oxidized Si 1-x-y Ge x C y films
Strained silicon germanium carbon (Si1-x-yGexCy or SiGeC) on silicon was oxidized using a novel photooxidation process. The… Expand
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Highly Cited
2001
Highly Cited
2001
Laser-scanned p-i-n photodiode (LSP) for image detection
Amorphous and microcrystalline glass/ZnO:Al/p(a-Si:H)/i(a-Si:H)/n(a-Si 1 - x C x :H)/Al imagers with different n-layer… Expand
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2000
2000
Reliability in Modeling of Spectroscopic Ellipsometry
Spectroscopic ellipsometry (SE) [1, 2] is a powerful non-destructive technique to determine the structure of silicon-based… Expand
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