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3LCD
3LCD is the name and brand of a major LCD projection color image generation technology used in modern digital projectors. 3LCD technology was…
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6 relations
Digital Light Processing
LCD projector
Pixel
Screen-door effect
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Broader (1)
Digital imaging
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
Exploration of the dynamics of brain activity in the conditions of executive control by means of the EEG method under using of the DLP and 3LCD projectors
A. Savostyanov
,
A. Saprygin
,
S. Tamozhnikov
,
A. Bocharov
IEEE Region International Conference on…
2015
Corpus ID: 16077671
The DLP and 3LCD projectors differ in the presentation techniques of color images. It is possible to suggest that the brain…
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2012
2012
Validating the Oxygen Performance of a Wine Closure
T. Keller
2012
Corpus ID: 53592505
Oxygen plays a key role in wine chemistry and aging as it affects the stability and sensory properties of wine. Amongst the…
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2011
2011
The Technology War : LCD vs . DLP
E. Powell
2011
Corpus ID: 30035675
It is important to note there is a third significant light engine technology called LCoS (liquid crystal on silicon). It is…
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2010
2010
Color‐tuning projection system for adaptive combination of high brightness and wide color gamut
M. Maeda
,
K. Arai
,
+5 authors
H. Kanayama
2010
Corpus ID: 60941848
Abstract— The demand for projectors with high brightness and wide color gamut has been increasing; however, UHP lamp projectors…
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2007
2007
Analysis of the proposed IEC "Color Illuminance" digital projector specification metric, using CIELAB gamut volume.
Karl Lang
2007
Corpus ID: 124459990
“Color Illuminance” is a proposed specification metric for IEC 61947-1 (Electronic projection – Measurement and documentation of…
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2007
2007
3LCD 1080P高清投影机——EPSON EMP-TW1000
凌霄
2007
Corpus ID: 109448982
1998
1998
Effects Of Etch-Induced Damage And Contamination On The Physical And Electrical Properties Of Cobalt Silicides
H. Kim
,
J. Jang
,
Y.H. Lee
,
J.K. Yoon
,
G. Yeom
Digest of Papers. Microprocesses and…
1998
Corpus ID: 45956150
Damage and residue remaining on the silicon wafer after oxide overetching using C4F8/H2 plasmas and the effects of various post…
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