Mechanisms for the intermetallic formation during the Sn-20In-2.8Ag/Ni soldering reactions

@article{Chuang2004MechanismsFT,
  title={Mechanisms for the intermetallic formation during the Sn-20In-2.8Ag/Ni soldering reactions},
  author={Tung-Han Chuang and K. W. Huang and W. H. Lin},
  journal={Journal of Electronic Materials},
  year={2004},
  volume={33},
  pages={374-381},
  url={https://api.semanticscholar.org/CorpusID:93104018}
}
The morphology and growth kinetics of intermetallic compounds formed during the interfacial reactions between liquid Sn-20In-2.8Ag solder and Ni substrates are investigated. Energy-dispersive x-ray (EDX) analysis identifies the composition of the interfacial intermetallics as Ni3(In0.99In0.01)4. The soldering reactions at lower temperatures (225–275°C) result in the predominant formation of a homogeneous intermetallic layer whose growth is diffusion controlled. At higher soldering temperatures… 

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