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Worst-case distance

In fabrication the yield is one of the most important measures. Also in the design phase engineers already try to maximize the yield by using… 
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Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2018
2018
Retention Time Modeling: The Key to Low-Power GC-eDRAMs
As seen in Chap. 2, gain-cell (GC) embedded DRAM (eDRAM), or GC-eDRAM in short, is an interesting alternative to static random… 
2017
2017
Lead electromagnetic model for an external lead with skin contact: A case study
We calculated the lead electromagnetic (LEM) model of an external lead with an electrode that contacts human skin at 123.2 MHz… 
2017
2017
Design of the Voltage-Controlled Ring Oscillator Using Optimization Tools (MunEDA® WiCkeD)
Integrated circuit design is a very complex and time-consuming task, despite several SPICE-like simulator tools being used to… 
2015
2015
Cooperation Improves Delay in Cognitive Networks With Hybrid Random Walk
In this paper, we study the capacity and delay scaling laws of cognitive radio networks (CRN) with static primary nodes (PNs) and… 
2013
2013
Robustness Metrics for Automotive Power Microelectronics
Automotive power micro-electronics complexity is driven by an ever and ever increasing demand for energy efficiency and safety… 
Review
2011
Review
2011
Analysis of selected methods for CMOS integrated circuit design for yield optimization
Two approaches for CMOS integrated circuit design taking into account a process variability and oriented towards optimization of… 
2010
2010
Reliability analysis of analog circuits using quadratic lifetime worst-case distance prediction
This paper proposes an efficient method to predict the lifetime yield of analog circuits considering the joint effects of… 
2008
2008
Implementation of a Deterministic Wireless Sensor Network
Currently, wireless sensor networks (WSNs) are not used in application scenarios that require timely reaction to sensor data for… 
2007
2007
Possibilistic Worst Case Distance and Applications to Circuit Sizing
The optimization methodology proposed in this work is inspired to [1] and is named Possibilistic Worst-Case Distance (PWCD). This… 
1999
1999
Yield optimization by design centering and worst-case distance analysis
Process variations invariably give rise to a parametric yield below 100% for VLSI circuits. Improving the yield by choosing a set… 
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