Worst-case distance

In fabrication the yield is one of the most important measures. Also in the design phase engineers already try to maximize the yield by using… (More)
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Papers overview

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2019
2019
Differential privacy, a notion of algorithmic stability, is a gold standard for measuring the additional risk an algorithm's… (More)
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2017
2017
We consider a visibility-based pursuit-evasion problem in which a single robot with an omnidirectional but unreliable sensor… (More)
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2012
2012
Abstract The reliability of analog integrated circuits becomes a major concern for the semiconductor industry as technology… (More)
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2010
2010
This paper proposes an efficient method to predict the lifetime yield of analog circuits considering the joint effects of… (More)
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2010
2010
As semiconductor technology scales, manufacture process-related statistical variations and lifetime-dependent degradations… (More)
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2007
2007
The optimization methodology proposed in this work is inspired to [1] and is named Possibilistic Worst-Case Distance (PWCD). This… (More)
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1999
1999
Process variations invariably give rise to a parametric yield below 100% for VLSI circuits. Improving the yield by choosing a set… (More)
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Highly Cited
1998
Highly Cited
1998
We consider the problem faced by a robot that must explore and learn an unknown room with obstacles in it. We seek algorithms… (More)
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Highly Cited
1991
Highly Cited
1991
The authors consider the problem faced by a newborn that must explore and learn an unknown room with obstacles in it. They seek… (More)
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1979
1979
Abstract This paper considers two related problems involving the design of rectangular layouts of m activities. In each of the… (More)
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