Worst-case distance

In fabrication the yield is one of the most important measures. Also in the design phase engineers already try to maximize the yield by using… (More)
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Topic mentions per year

Topic mentions per year

1998-2016
01219982016

Papers overview

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2017
2017
We calculated the lead electromagnetic (LEM) model of an external lead with an electrode that contacts human skin at 123.2 MHz… (More)
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2013
2013
The problem of identifying a fixed-order FIR approximation of linear systems with unknown structure, assuming that both input and… (More)
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2012
2012
As semiconductor technology continuously scales, the joint effects of manufacture process variations and operational lifetime… (More)
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2012
2012
The integration of Unmanned Aerial Vehicles (UAVs) requires new methods to certify collision avoidance systems. This paper… (More)
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2010
2010
This paper proposes an efficient method to predict the lifetime yield of analog circuits considering the joint effects of… (More)
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2010
2010
As semiconductor technology scales, manufacture process-related statistical variations and lifetime-dependent degradations… (More)
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2009
2009
  • G.E. Muller-L
  • IEEE Transactions on Semiconductor Manufacturing
  • 2009
This paper proposes a yield model for integrated circuits that includes the impact of design measures for robust design as well… (More)
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2007
2007
Currently, wireless sensor networks (WSNs) are not used in application scenarios that require timely reaction to sensor data for… (More)
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1999
1999
Process variations invariably give rise to a parametric yield below 100% for VLSI circuits. Improving the yield by choosing a set… (More)
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Highly Cited
1998
Highly Cited
1998
We consider the problem faced by a robot that must explore and learn an unknown room with obstacles in it. We seek algorithms… (More)
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