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Test card

Known as: Test tone, Tv test pattern, Test pattern 
A test card, also known as a test pattern or start-up/closedown test is a television test signal, typically broadcast at times when the transmitter… 
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Related topics

Related topics

13 relations

Broader (1)

Broadcast engineering
Cathode ray tubeDigital Video BroadcastingIRE (unit)Integrated receiver/decoder

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2004
2004
Mixed RL-Huffman encoding for power reduction and data compression in scan test
This paper mixes two encoding techniques to reduce test data volume, test pattern delivery time and power dissipation in scan… 
Highly Cited
2004
Highly Cited
2004
ELF-Murphy data on defects and tests sets
LSI logic has designed and manufactured two test chips at CRC. These test chips were used to investigate the characteristics of… 
Highly Cited
1999
Highly Cited
1999
On calculating efficient LFSR seeds for built-in self test
Linear Feedback Shift Registers (LFSRs) are commonly used as pseudo-random test pattern generators (TPGs) in BIST schemes. This… 
Highly Cited
1997
Highly Cited
1997
An efficient method for compressing test data
The overall throughput of automatic test equipment (ATE) is sensitive to the download time of test data. An effective approach to… 
1996
1996
A complexity analysis of sequential ATPG
The research reported in this paper has been conducted to identify those attributes, of both sequential circuits and structural… 
Highly Cited
1995
Highly Cited
1995
Complexity of sequential ATPG
The research reported in this paper was conducted to identify those attributes, of both sequential circuits and structural… 
Highly Cited
1994
Highly Cited
1994
Test embedding with discrete logarithms
When using Built-In Self Test (BIST) for testing VLSI circuits, a major concern is the generation of proper test patterns that… 
1992
1992
A small test generator for large designs
We report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations… 
1991
1991
A test-pattern-generation algorithm for sequential circuits
A deterministic test-pattern-generation algorithm for synchronous sequential circuits is presented. The algorithm, called… 
Highly Cited
1977
Highly Cited
1977
Test generation for large logic networks
A system for automatic test pattern generation for large logic networks is described. The network to be tested is assumed to…