Surface photovoltage

Surface photovoltage (SPV) measurements are a widely used method to determine the minority carrier diffusion length of semiconductors. Since the… (More)
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Topic mentions per year

Topic mentions per year

1975-2017
051019752017

Papers overview

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2017
2017
Surface photovoltage (SPV) method was used to evaluate the silicon-sapphire interface potential barrier of silicon on sapphire… (More)
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2011
2011
Photoelectron spectroscopy ~PES! has been used to measure the dependence of core-level shifts on temperature T and source… (More)
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2010
2010
Summary form only given. The quantum efficiency of negative electron affinity (NEA) GaAs photocathodes mainly depends on the… (More)
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2009
2009
We succesfully prepared the surface photovoltage sensor system using several types of modified mesoporous silica as a sensitive… (More)
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2006
2006
The potentiality of photocurrent (PC) and surface photovoltage spectroscopy (SPS) analyses in the determination of the band gap… (More)
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2004
2004
Conductive atomic force microscopy ~C-AFM! and surface photovoltage ~SPV! microscopy were used to investigate local electronic… (More)
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Review
2001
Review
2001
The possibility of obtaining a detailed picture of the electronic structure makes surface photovoltage spectroscopy (SPS… (More)
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2000
2000
In this work a novel method to characterize quantum well (QW) structures and devices is presented. The method is based on the… (More)
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1985
1985
A complete theory for the constant-magnitude steady-state surface photovoltage (SPV) technique is developed. Emphasis is placed… (More)
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1975
1975
A scanned surface photovoltage (SSP) method is capable of detecting a wide variety of defects in a silicon surface. This method… (More)
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