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Spectrometry, Mass, Secondary Ion
Known as:
Secondary Ion Mass Spectroscopy Microscopy
, Spectroscopy, Mass, Secondary Ion
, Mass Spectrometry, Secondary Ion
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A mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5-20 kiloelectronvolts (keV…
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National Institutes of Health
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2014
Highly Cited
2014
Multiplexed ion beam imaging of human breast tumors
Michael Angelo
,
S. Bendall
,
+9 authors
G. Nolan
Nature Network Boston
2014
Corpus ID: 18324677
Immunohistochemistry (IHC) is a tool for visualizing protein expression that is employed as part of the diagnostic workup for the…
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Review
2013
Review
2013
Nano-magnetite (Fe3O4) as a support for recyclable catalysts in the development of sustainable methodologies.
M. B. Gawande
,
P. Branco
,
R. Varma
Chemical Society Reviews
2013
Corpus ID: 29778147
Surface functionalization of nano-magnetic nanoparticles is a well-designed way to bridge the gap between heterogeneous and…
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Highly Cited
2011
Highly Cited
2011
Detailed studies of a high-capacity electrode material for rechargeable batteries, Li2MnO3-LiCo(1/3)Ni(1/3)Mn(1/3)O2.
N. Yabuuchi
,
K. Yoshii
,
Seung‐Taek Myung
,
I. Nakai
,
S. Komaba
Journal of the American Chemical Society
2011
Corpus ID: 22807553
Lithium-excess manganese layered oxides, which are commonly described by the chemical formula zLi(2)MnO(3)-(1-z)LiMeO(2) (Me = Co…
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Review
2010
Review
2010
Cluster secondary ion mass spectrometry of polymers and related materials.
C. Mahoney
Mass spectrometry reviews (Print)
2010
Corpus ID: 17151143
Cluster secondary ion mass spectrometry (cluster SIMS) has played a critical role in the characterization of polymeric materials…
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Highly Cited
2009
Highly Cited
2009
N-Doping of Graphene Through Electrothermal Reactions with Ammonia
Xinran Wang
,
Xiaolin Li
,
+5 authors
H. Dai
Science
2009
Corpus ID: 206518361
Negatively Doped Graphene Nanoribbons The potential applications in electronic devices of graphene (single atom, thick layers of…
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Review
2009
Review
2009
Advances in imaging secondary ion mass spectrometry for biological samples.
S. Boxer
,
M. Kraft
,
P. Weber
Annual Review of Biophysics
2009
Corpus ID: 38454116
Imaging mass spectrometry combines the power of mass spectrometry to identify complex molecules based on mass with sample imaging…
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Review
2007
Review
2007
Imaging mass spectrometry.
L. McDonnell
,
R. Heeren
Mass spectrometry reviews (Print)
2007
Corpus ID: 7668690
Imaging mass spectrometry combines the chemical specificity and parallel detection of mass spectrometry with microscopic imaging…
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Highly Cited
2004
Highly Cited
2004
Time-of-flight secondary ion mass spectrometry (TOF-SIMS):--versatility in chemical and imaging surface analysis.
R. Sodhi
In Analysis
2004
Corpus ID: 41117842
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has emerged as one of the most important and versatile surface…
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Highly Cited
2003
Highly Cited
2003
A C60 primary ion beam system for time of flight secondary ion mass spectrometry: its development and secondary ion yield characteristics.
D. Weibel
,
S. Wong
,
N. Lockyer
,
P. Blenkinsopp
,
R. Hill
,
J. Vickerman
Analytical Chemistry
2003
Corpus ID: 20754060
A buckminsterfullerene (C60)-based primary ion beam system has been developed for routine application in TOF-SIMS analysis of…
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Review
1984
Review
1984
Fourier transform mass spectrometry.
M. Gross
,
D. Rempel
Science
1984
Corpus ID: 1139019
Fourier transform mass spectrometry will play an important role in the future because of its unique combination of high mass…
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