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Secondary ion mass spectrometry

Known as: Secondary ionization, Secondary-ion mass spectrometry, Liquid secondary ionization 
Secondary ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of… 
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Papers overview

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Highly Cited
2019
Highly Cited
2019
All-solid-state lithium-ion batteries (ASSBs) are expected to represent a future alternative compared to conventional lithium-ion… 
2016
2016
We document the development of a suite of carbonate mineral reference materials for calibrating SIMS determinations of δ18O in… 
2014
2014
In principle, secondary ion mass spectrometry (SIMS) molecule-specific imaging has vast implications in biological research where… 
Highly Cited
2009
Highly Cited
2009
We reared primary polyps (new recruits) of the common Atlantic golf ball coral Favia fragum for 8 days at 25°C in seawater with… 
1992
1992
Secondary ion mass spectroscopy (SIMS) is an ion beam analysis technique useful for characterising the top few micrometres of… 
Highly Cited
1991
Highly Cited
1991
We combine laboratory and Apollo observations to describe the sputtering of the lunar surface and the composition of the ejecta… 
Highly Cited
1989
Highly Cited
1989
ANALYSIS CONDITIONS. Primary Beam. Primary Beam Energy. Angle of Incidence. Sputtering Rate. Detected Area. Species Monitored… 
Highly Cited
1987
Highly Cited
1987
Ion-Solid Interaction. Aspects of Quantitative Elemental Sims-Analysis. Instrumentalion. Operational Modes. Application of Sims…