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Secondary ion mass spectrometry

Known as: Secondary ionization, Secondary-ion mass spectrometry, Liquid secondary ionization 
Secondary ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of… Expand
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Papers overview

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Highly Cited
2019
Highly Cited
2019
All-solid-state lithium-ion batteries (ASSBs) are expected to represent a future alternative compared to conventional lithium-ion… Expand
Highly Cited
2016
Highly Cited
2016
Zircon U–Pb geochronology has become a keystone tool across Earth science, arguably providing the gold standard in resolving deep… Expand
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2014
2014
In principle, secondary ion mass spectrometry (SIMS) molecule-specific imaging has vast implications in biological research where… Expand
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Highly Cited
2010
Highly Cited
2010
Abstract We introduce a technique for U–Pb dating of baddeleyite using secondary ion mass spectrometry (SIMS) in situ analysis of… Expand
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Review
2005
Review
2005
Abstract Heterogeneous catalysts are highly complex materials with respect to both their composition and structure. The reaction… Expand
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Highly Cited
1998
Highly Cited
1998
Abstract Several fractions of oligomeric and polymeric procyanidins have been obtained from grape seeds by gel chromatography on… Expand
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1992
1992
Secondary ion mass spectroscopy (SIMS) is an ion beam analysis technique useful for characterising the top few micrometres of… Expand
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Highly Cited
1991
Highly Cited
1991
We combine laboratory and Apollo observations to describe the sputtering of the lunar surface and the composition of the ejecta… Expand
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Highly Cited
1989
Highly Cited
1989
ANALYSIS CONDITIONS. Primary Beam. Primary Beam Energy. Angle of Incidence. Sputtering Rate. Detected Area. Species Monitored… Expand
Highly Cited
1987
Highly Cited
1987
Ion-Solid Interaction. Aspects of Quantitative Elemental Sims-Analysis. Instrumentalion. Operational Modes. Application of Sims… Expand