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Secondary ion mass spectrometry

Known as: Secondary ionization, Secondary-ion mass spectrometry, Liquid secondary ionization 
Secondary ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of… Expand
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Papers overview

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2014
2014
In principle, secondary ion mass spectrometry (SIMS) molecule-specific imaging has vast implications in biological research where… Expand
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2012
2012
Abstract We present a secondary ionization mass spectrometry (SIMS) technique for U–Pb geochronology of rutile at high spatial… Expand
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Highly Cited
2010
Highly Cited
2010
Abstract We introduce a technique for U–Pb dating of baddeleyite using secondary ion mass spectrometry (SIMS) in situ analysis of… Expand
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Highly Cited
2002
Highly Cited
2002
We study the influence of nitrogen, a potential acceptor in ZnO, on the lattice dynamics of ZnO. A series of samples grown by… Expand
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Highly Cited
1998
Highly Cited
1998
Abstract Several fractions of oligomeric and polymeric procyanidins have been obtained from grape seeds by gel chromatography on… Expand
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Highly Cited
1994
Highly Cited
1994
We report here a detailed mineralogical, geochemical, and experimental study of a high-Ca boninite suite from the northern… Expand
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1992
1992
Secondary ion mass spectroscopy (SIMS) is an ion beam analysis technique useful for characterising the top few micrometres of… Expand
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Highly Cited
1991
Highly Cited
1991
We combine laboratory and Apollo year on the moon) every surface species has been observations to describe the sputtering of the… Expand
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Highly Cited
1989
Highly Cited
1989
ANALYSIS CONDITIONS. Primary Beam. Primary Beam Energy. Angle of Incidence. Sputtering Rate. Detected Area. Species Monitored… Expand
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Highly Cited
1987
Highly Cited
1987
Ion-Solid Interaction. Aspects of Quantitative Elemental Sims-Analysis. Instrumentalion. Operational Modes. Application of Sims… Expand
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