Secondary ion mass spectrometry

Known as: Secondary ionization, Secondary-ion mass spectrometry, Liquid secondary ionization 
Secondary ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of… (More)
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2013
2013
Cluster secondary ion mass spectrometry (SIMS) has had a significant impact on the mass spectrometry and surface analysis… (More)
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Review
2012
Review
2012
This article provides an overview of the technique of secondary ion mass spectrometry imaging and highlights some current and… (More)
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2011
2011
The adsorption of bovine serum albumin (BSA), immunoglobulin G (IgG) and fibrinogen (Fgn) on fluorinated selfassembled monolayers… (More)
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2008
2008
Transmission electron microscopy (TEM)/Secondary ion mass spectrometry (SIMS) biofilm sample preparation: Samples of biofilm were… (More)
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2007
2007
We combine laboratory and Apollo year on the moon) every surface species has been observations to describe the sputtering of the… (More)
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2006
2006
This paper reports the results of the elemental identification and depth profiling by secondary ion mass spectrometry (SIMS) of… (More)
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2005
2005
Liquid secondary-ion mass spectrometry (liquid SIMS) is an obsolescent ionization technique that revolutionized the analyses of… (More)
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Highly Cited
1998
Highly Cited
1998
II. Experimental Parameters in MALDI-MS… (More)
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1998
1998
This paper presents a set of data which compares the potential and limitations of laser microprobe mass spectrometry (TOFLMMS and… (More)
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1988
1988
mental standards, and by statistical and systematic errors in the measurement of x-ray lines and in the separation of line… (More)
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