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Residual stress
Known as:
Residual
Residual stresses are stresses that remain in a solid material after the original cause of the stresses has been removed. Residual stress may be…
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Related topics
Related topics
8 relations
Crystal structure
Mesoscopic physics
Season cracking
Semiconductor device fabrication
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Broader (1)
Failure
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
Recent Progress of Additive Manufactured Ti-6 Al-4 V by Electron Beam Melting
Pan Wang
,
M. L. Nai
,
+7 authors
Jun Wei
2016
Corpus ID: 167211586
Electron beam melting (EBM) is one of the powder-bed fusion additive manufacturing technologies. This technology is very suitable…
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Highly Cited
2009
Highly Cited
2009
Effects of surface and initial stresses on the bending stiffness of trilayer plates and nanofilms
Hanxing Zhu
,
Jianxiang Wang
,
B. Karihaloo
2009
Corpus ID: 56331102
2009
2009
A two-parameter model for crack growth simulation by combined FEM-DBEM approach
R. Citarella
,
G. Cricrì
Advances in Engineering Software
2009
Corpus ID: 4958942
Highly Cited
2008
Highly Cited
2008
Novel High-$Q$ MEMS Curled-Plate Variable Capacitors Fabricated in 0.35-$\mu{\hbox {m}}$ CMOS Technology
M. Bakri-Kassem
,
S. Fouladi
,
R. Mansour
IEEE transactions on microwave theory and…
2008
Corpus ID: 15727887
Two microelectromechanical systems (MEMS) curled-plate variable capacitors, built in 0.35-mum CMOS technology, are presented. The…
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2006
2006
A numerical analysis of spherical indentation response of thin hard films on soft substrates
S. K. Vanimisetti
,
R. Narasimhan
2006
Corpus ID: 136578706
Highly Cited
2002
Highly Cited
2002
Dynamics of Splat Formation in Plasma Spray Coating Process
J. Mostaghimi
,
M. Pasandideh-Fard
,
S. Chandra
2002
Corpus ID: 54595579
The paper describes recent developments in modeling formation of plasma spray coatings. Specific attention is paid to the three…
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2002
2002
Microstructure and mechanical properties of WC–C nanocomposite films
Se Jun Park
,
Kwang-Ryeol Lee
,
D. Ko
,
K. Eun
2002
Corpus ID: 55986469
2001
2001
Copper precipitates in 15 NiCuMoNb 5 (WB 36) steel : material properties and microstructure, atomistic simulation, and micromagnetic NDE techniques
I. Altpeter
,
G. Dobmann
,
+4 authors
S. Schmauder
2001
Corpus ID: 55497381
1998
1998
Improvement in adhesion of diamond films on cemented WC substrate with Ti–Si interlayers
Chii-Ruey Lin
,
C. Kuo
,
R. Chang
1998
Corpus ID: 54530876
1990
1990
Stress dependence of leaky surface wave on PMMA by line-focus-beam acoustic microscope
M. Obata
,
H. Shimada
,
Tsuyoshi Mihara
1990
Corpus ID: 96461203
The authors discuss a line-focus-beam (LFB) acoustic microscope as a system for evaluating local stresses in polymeric materials…
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