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Quantum metrology
Quantum metrology is the study of making high-resolution and highly sensitive measurements of physical parameters using quantum theory to describe…
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Related topics
Related topics
10 relations
Heisenberg limit
NOON state
Quantum entanglement
Quantum lithography
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Broader (2)
Quantum information science
Quantum mechanics
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
Review
2010
Review
2010
Practical Examples on Traceability, Measurement Uncertainty and Validation in Chemistry, volume 1
L. Benedik
,
S. Duţă
,
+8 authors
E. Vassileva
2010
Corpus ID: 65259646
Examples on traceability, measurement uncertainty and validation for measurements of retinol and α‐tocopherol in human serum…
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2007
2007
The generation of nondiffracting beams using inexpensive computer-generated holograms
C. López-Mariscal
,
J. Gutiérrez-Vega
2007
Corpus ID: 40843179
We present a simple experimental procedure for producing a computer-generated hologram of good quality. As an example, the…
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2005
2005
Attosecond Metrology with Controlled Light Waveforms
M. Uiberacker
,
E. Goulielmakis
,
+6 authors
F. Krausz
2005
Corpus ID: 117695318
The electric field oscillations of visible light change their sign about 10(15) limes per second, and, therefore, the field…
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2003
2003
Automatic differential techniques and their application in metrology.
R. Boudjemaa
,
M. Cox
,
A. B. Forbes
,
P. Harris
2003
Corpus ID: 215860462
This report describes Automatic Differentiation techniques and their use in metrology. Automatic Differentiation (AD) is a term…
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Review
2002
Review
2002
Sheet resistance and electrical linewidth test structures for semiconductor process characterisation
Stewart Smith
2002
Corpus ID: 98785892
• Research work on advanced and novel photomask metrology, including submission of EPSRC grant application on this topic…
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2001
2001
Minimization of mechanical and chemical strain at dielectric-semiconductor and internal dielectric interfaces in stacked gate dielectrics for advanced CMOS devices
G. Lucovsky
,
J. C. Phillips
,
M. Thorpe
2001
Corpus ID: 109461447
This paper identifies fundamental aspects of Si-dielectric and internal dielectric interfaces that limit the ultimate performance…
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1999
1999
Testing spreadsheets and other packages used in metrology: a case study.
H. Cook
,
M. Cox
,
M. Dainton
,
P. Harris
1999
Corpus ID: 208975039
A case study that illustrates the application of a general methodology for testing the numerical accuracy of scientific software…
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1997
1997
Advanced Mathematical Tools in Metrology III
P. Ciarlini
1997
Corpus ID: 60300798
An efficient algorithm for template matching, I.J. Anderson et al an application of bootstrap regression to metrological data…
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1988
1988
Statistical concepts in metrology
H. H. Ku
1988
Corpus ID: 64509716
1973
1973
Sumerian numeration and metrology
M. Powell
1973
Corpus ID: 128054028