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Known as: ?????????:???????:??????:XXX:???:??, Unspecified body region US No charge, sin cargo:hallazgo:punto en el tiempo:XXX:Narrativo:ultrasonido 
 
National Institutes of Health

Papers overview

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2016
2016
Charge-trap memory thin-film transistors (CTM-TFTs) using In-Ga-ZnO (IGZO) thin films as active channel and charge trap layers… Expand
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2014
2014
The synthesis, electrochemical, and photophysical properties of five multicomponent systems featuring a Zn(II) porphyrin (ZnP… Expand
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2012
2012
The measurement of the entire ID-VG characteristic of a nanoscaled pMOSFET before and after the capture of a single elementary… Expand
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Highly Cited
2011
Highly Cited
2011
We demonstrate that the use of a monolayer graphene as a gate electrode on top of a high-κ gate dielectric eliminates mechanical… Expand
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2011
2011
The present paper highlights results of a systematic study of photoinduced electron transfer, where the fundamental aspects of… Expand
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2009
2009
Reliability of charge trapping (CT) devices has been examined in detail, and the path to sub-30nm NAND flash is investigated. All… Expand
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2008
2008
We have observed transport of nano-particles having, on average, a fractional elementary charge in single pulse and double pulse… Expand
2006
2006
Positive constant voltage stress combined with charge pumping (CP) measurements was applied to study trap generation phenomena in… Expand
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Highly Cited
2001
Highly Cited
2001
The ultimate limit in the operation of an electronic device is the manipulation of a single charge. Such a limit has been… Expand
1999
1999
Abstract A new charge pumping (CP) technique is proposed to obtain the spatial profile of interface-state density ( N it ) and… Expand
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