N-4-(4-methoxyphenylaminosulfonyl)benzoisoselenothiazolidone

Known as: N-MeOPhNS-BIST 
 
National Institutes of Health

Topic mentions per year

Topic mentions per year

2003-2015
01220032015

Papers overview

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2016
2016
  • Mustafa Nihat Demirci
  • 2016
Environmental pollution has detrimental effects on the quality of our life and its scope has reached such an extent that measures… (More)
  • table II
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2015
2015
Even though a circuit is designed error-free, manufactured circuits may not function correctly. Since the manufacturing process… (More)
  • figure 2
  • figure 1
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Review
2015
Review
2015
  • 1 Prabhakaran, 2 Praveen
  • 2015
Scan-based Built-In Self-Test (SC-BIST) Test Pattern Generator (TPG) reduces transitions which occur at the inputs of scan during… (More)
  • table II
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2013
2013
This paper presents a low hardware overhead test pattern generator (TPG) for scan-based Built-In Self-Test (BIST) that can reduce… (More)
  • figure 6
  • figure 6.1
  • figure 8.1
  • figure 8.2
  • figure 7.3
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2011
2011
Thapar University, Patiala for her continuous guidance and support throughout this report work. I am truly very fortunate to have… (More)
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2011
2011
A generic built-in self-test needed for SoC devices implementing for low power consumption. In this we proposed a new technique… (More)
  • table 1
  • table 2
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2008
2008
In the last 40 years there has been an exponential increase in the number of transistors per processor. This increase has been… (More)
  • figure 1
  • figure 5
  • figure 4
  • figure 6
  • figure 7
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2003
2003
We present experimental results from the Murphy and ELF35 test chip experiments to try to answer the following questions related… (More)
  • table 1
  • table 2
  • table 3
  • table 4
  • table 5
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