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N-4-(4-fluorophenylaminosulfonyl)benzoisoselenothiazolidone
Known as:
N-FPhNS-BIST
National Institutes of Health
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Related topics
Related topics
3 relations
Broader (3)
Lipoxygenase Inhibitors
Organoselenium Compounds
Sulfonamides
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
KURUMSAL YÖNETİMİN BIST ŞİRKETLERİNİN PERFORMANSLARINA ETKİSİNİN ARAŞTIRILMASI
Songül Kakilli Acaravci
,
S. Kandır
,
Ahmet Zelka
2015
Corpus ID: 153567238
Aim of this study is to investigate the impact of corporate governance practices on corporate performance. Sample of the study…
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Review
2014
Review
2014
GROUNDWATER RESOURCES IN BIST-DOAB REGION, PUNJAB, INDIA - AN OVERVIEW
G. Krishan
,
Rao
,
+8 authors
Geetashree Singh
2014
Corpus ID: 86139946
An increase in groundwater stress in Bist-Doab region of Punjab due to increase in irrigation demand, domestic requirement and…
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2014
2014
An Integrated Approach to Augment the Depleting Ground Water Resource in Bist-Doab, Region of Punjab, India
M. Sharma
,
D. Rathore
,
G. Krishan
2014
Corpus ID: 132809718
Water is the most essential component for all the living things. Ground water is commonly used for drinking, domestic purposes…
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2014
2014
Reducing Test Power and Improving Test Effectiveness for Logic BIST
Weizheng Wang
,
Cai Shuo
,
Lingyun Xiang
2014
Corpus ID: 16883348
Excessive power dissipation is one of the major issues in the testing of VLSI systems. Many techniques are proposed for scan test…
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2009
2009
A BIST TPG for Low Power Dissipation and High Fault Coverage
R. Madhusudhanan
,
R. Balarani
2009
Corpus ID: 55063359
This paper presents a low hardware overhead test pattern generator (TPG) for scan-based built-in self-test (BIST) that can reduce…
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2008
2008
A novel linear histogram BIST for ADC
Jianguo Ren
,
Jianhua Feng
,
Hongfei Ye
9th International Conference on Solid-State and…
2008
Corpus ID: 10873307
This paper proposes a novel histogram BIST scheme for ADC static testing. For a monotonic ADC, the out codes have an approximate…
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2005
2005
Low-power test pattern generator design for BIST via non-uniform cellular automata
H. Kiliç
,
L. Oktem
IEEE VLSI-TSA International Symposium on VLSI…
2005
Corpus ID: 16211979
An efficient low-power test pattern generator (TPG) design for built-in self-test (BIST) is introduced. The approach uses the non…
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1993
1993
Design verification techniques for system level testing using ASIC level BIST implementations
C. Stroud
,
Gang Liang
Sixth Annual IEEE International ASIC Conference…
1993
Corpus ID: 60547011
Requirements and design verification techniques for system level testing using BIST implementations in ASICs are discussed. A…
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1990
1990
Migration, a spatial perspective : (a case study of Bist Doab-Punjab)
S. Mehta
1990
Corpus ID: 176003323
1985
1985
Built-In Self-Test Trends in Motorola Microprocessors
R. Gary Daniels
,
William C. Bruce
IEEE Design & Test of Computers
1985
Corpus ID: 22719798
The first built-in self-test feature in a Motorola sidered a ¿wart¿ until a RAM test application recast it as a ¿ feature…
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