Skip to search formSkip to main contentSkip to account menu

Mechanical probe station

Known as: Probe station 
A mechanical probe station is used to physically acquire signals from the internal nodes of a semiconductor device. The probe station utilizes… 
Wikipedia (opens in a new tab)

Related topics

Related topics

2 relations
Failure analysisWire bonding

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
Nanorobotic RF probe station for calibrated on-wafer measurements
This work describes a new generation of instrumentation that aims to address the challenge of on-wafer measurement of nanodevices… 
2012
2012
60-GHz CMOS integrated on-chip Yagi antenna and balun bandpass filter in 90-nm CMOS technology
This paper presents the design of a 60-GHz CMOS integrated on-chip Yagi antenna with balun bandpass filter by using 90-nm CMOS… 
2009
2009
Fabrication and Characterization of Microscaled On-Chip Toroidal Inductors
Microscaled on-chip toroidal inductors with ultrahigh quality factor (Q-factor) at tens of gigahertz have been successfully… 
2008
2008
Application of adaptive probing for fault diagnosis in computer networks
This dissertation presents an adaptive probing based tool for fault diagnosis in computer networks by addressing the problems of… 
2008
2008
Efficient probe selection algorithms for fault diagnosis
Increase in the network usage for more and more performance critical applications has caused a demand for tools that can monitor… 
2008
2008
High Q-factor CMOS-MEMS inductor
This study investigates a high Q-factor spiral inductor fabricated by the CMOS (complementary metal oxide semiconductor) process… 
2007
2007
Efficient Probing Techniques for Fault Diagnosis
  • M. NatuA. Sethi
  • Second International Conference on Internet…
  • 2007
  • Corpus ID: 15560651
Increase in the network usage and the widespread application of networks for more and more performance critical applications has… 
2004
2004
Leakage current correction in quasi-static C-V measurements
The gate current in a MOS structure can deform the result of a quasi-static capacitance-voltage measurement. In this paper… 
2001
2001
Design and results from the APV 25 , a deep submicron CMOS front-end chip for the CMS tracker
The APV25 is a 128-channel analogue pipeline chip for the readout of silicon microstrip detectors in the CMS tracker at the LHC… 
1999
1999
Microassembly using auditory display of force feedback
To assemble hinged MEMS structures, a probe station with visual feedback has been used. With a feedback in the visual domain only… 
By clicking accept or continuing to use the site, you agree to the terms outlined in our Privacy Policy (opens in a new tab), Terms of Service (opens in a new tab), and Dataset License (opens in a new tab)