International Electron Devices Meeting

The IEEE International Electron Devices Meeting (IEDM) is an annual micro- and nanoelectronics conference held each December that serves as a forum… (More)
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Topic mentions per year

Topic mentions per year

1983-2015
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Papers overview

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2015
2015
The Quanta Image Sensor (QIS) is a possible 3 generation image sensor. A QIS consists of a large array of photodetectors (perhaps… (More)
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2015
2015
This paper reports on the first implementation of low voltage complementary logic (< 1.5 V) by using bodybiased aluminum nitride… (More)
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Review
2010
Review
2010
Scaling of CMOS technology has made major innovations in the last decade with the introduction of strained silicon and high-k… (More)
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Highly Cited
2006
Highly Cited
2006
This article is reprinted from the Internaional Electron Devices Meeting (1975). It discusses the complexity of integrated… (More)
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2005
2005
  • IEEE Circuits and Devices Magazine
  • 2005
 
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2004
2004
This year marks the 50th anniversary of the IEEE Electron Devices Society’s (EDS’s) annual technical conference, the… (More)
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2004
2004
The integration of electronic and optical devices on one chip has been changed the view of an optical system from a traditional… (More)
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Highly Cited
2003
Highly Cited
2003
P ower consumption is now the major technical problem facing the semiconductor industry. In comments on this problem at the 2002… (More)
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Review
2003
Review
2003
on issues related to vacuum electronics, where the real opportunities were perceived to lie. Fortunately, Walter Brattain was one… (More)
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2000
2000
The neuron-MOS (neu-MOS) transistor, recently discovered by Shibata and Ohmi in 1991 [T. Shibata, T. Ohmi, International Electron… (More)
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