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International Electron Devices Meeting

The IEEE International Electron Devices Meeting (IEDM) is an annual micro- and nanoelectronics conference held each December that serves as a forum… (More)
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Topic mentions per year

Topic mentions per year

1983-2015
012319832015

Related topics

Related topics

7 relations
CMOSCustom Integrated Circuits ConferenceInternational Solid-State Circuits ConferenceMicroelectromechanical systems
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Related mentions per year

Related mentions per year

1939-2018
19401960198020002020
International Electron Devices Meeting
CMOS
Microwave
Semiconductor
Microelectromechanical systems
Custom Integrated Circuits Conference

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
TCAD Modeling of Devices for Quanta Image Sensors
The Quanta Image Sensor (QIS) is a possible 3 generation image sensor. A QIS consists of a large array of photodetectors (perhaps… (More)
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2015
2015
Body-Biased Complementary Logic Implemented Using AIN Piezoelectric MEMS Switches
This paper reports on the first implementation of low voltage complementary logic (< 1.5 V) by using bodybiased aluminum nitride… (More)
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Review
2010
Review
2010
TxACE Analog Symposium
Scaling of CMOS technology has made major innovations in the last decade with the introduction of strained silicon and high-k… (More)
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Highly Cited
2006
Highly Cited
2006
Progress in digital integrated electronics [Technical literaiture, Copyright 1975 IEEE. Reprinted, with permission. Technical Digest. International Electron Devices Meeting, IEEE, 1975, pp. 11-13.]
This article is reprinted from the Internaional Electron Devices Meeting (1975). It discusses the complexity of integrated… (More)
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2005
2005
Conference Spotlight - 2005 IEEE International Electron Devices Meeting
  • IEEE Circuits and Devices Magazine
  • 2005
 
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2004
2004
Conference spotlight - International electron devices meeting celebrates 50 years
This year marks the 50th anniversary of the IEEE Electron Devices Society’s (EDS’s) annual technical conference, the… (More)
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2004
2004
Porous materials with ultra-low optical constants for integrated optical devices applications
The integration of electronic and optical devices on one chip has been changed the view of an optical system from a traditional… (More)
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Highly Cited
2003
Highly Cited
2003
Leakage Current: Moore's Law Meets Static Power
P ower consumption is now the major technical problem facing the semiconductor industry. In comments on this problem at the 2002… (More)
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Review
2003
Review
2003
Moore ’ s Law : A Department of Defense Perspective
on issues related to vacuum electronics, where the real opportunities were perceived to lie. Fortunately, Walter Brattain was one… (More)
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2000
2000
Pii: S0026-2692(00)00032-x
The neuron-MOS (neu-MOS) transistor, recently discovered by Shibata and Ohmi in 1991 [T. Shibata, T. Ohmi, International Electron… (More)
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